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MPC563XM Reference Manual, Rev. 1
1352
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
The boundary scan register is enabled for serial access between TDI and TDO when the EXTEST,
SAMPLE or SAMPLE/PRELOAD instructions are active. The single-bit bypass register shift stage is
enabled for serial access between TDI and TDO when the HIGHZ, CLAMP or reserved instructions are
active. The functionality of each test mode is explained in more detail in
31.2.3.3
Bypass Mode
When no test operation is required, the BYPASS instruction can be loaded to place the JTAGC block into
bypass mode. While in bypass mode, the single-bit bypass shift register is used to provide a
minimum-length serial path to shift data between TDI and TDO.
31.3
External Signal Description
31.3.1
Overview
The JTAGC consists of 5 signals that connect to off chip development tools and allow access to test support
functions. The JTAGC signals are outlined in
31.3.2
Detailed Signal Descriptions
This section describes each of the signals listed in
in more detail.
31.3.2.1
TCK - Test Clock Input
Test Clock Input (TCK) is an input pin used to synchronize the test logic and control register access
through the TAP.
31.3.2.2
TDI - Test Data Input
Test Data Input (TDI) is an input pin that receives serial test instructions and data. TDI is sampled on the
rising edge of TCK.
Table 31-4. JTAG Signal Properties
Name
I/O
Function
Reset State
Pull
1
1
The pull is not implemented in this block. Pullup/pulldown devices are implemented in the pads.
TCK
Input
Test Clock
-
Down
TDI
Input
Test Data In
-
Up
TDO
Output
Test Data Out
High Z
2
2
TDO output buffer enable is negated when the JTAGC is not in the Shift-IR or Shift-DR states. A
weak pull may be implemented at the TDO pad for use when JTAGC is inactive.
-
TMS
Input
Test Mode Select
-
Up
JCOMP
Input
JTAG Compliancy
-
Down
Содержание MPC5632M
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