Fluke 9000A-Z80QT, Инструкция по эксплуатации

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Z8OQT
TABLE OF
CONTENTS,
(continued)
SECTION TITLE
PAGE
3-18. Using the 9000 Series for Quick RAM Testing
.......
3-10
3-19. Using the 9000 Series for Quick ROM Testing
.......
3—13
3—20.
Using the 9100 Series for Quick RAM Testing
.......
3-15
3—21.
Using the 9100 Series for Quick ROM Testing
.......
3-15
3—22.
QUICK
FILL AND VERIFY
.....................
3-16
3—23.
Using the 9000 Series for Quick Fill and
Verify
......
3-16
3-24. Using the 9100 Series for Quick Fill and
Verify
......
3-17
3-25.
MARGINAL
OUT
PROBLEMS
..................
3-19
3—26
Introduction
................................
3—19
3-27.
UUT Operating Speed and Memory Access
........
3-19
3—28.
UUT Noise Levels
............................
3—19
3—29.
Bus Loading
................................
3-19
3-30. Clock Loading
..............................
3-20
3-31.
POD DRIVE
CAPABILITY
.....................
3-20
3-32. POWER FAILURE DETECTION
LIMITS
.........
3—20
THEORY OF OPERATION
............................
4-1
4-]. INTRODUCTION
.............................
4-1
4-2.
GENERALPOD OPERATION
...................
4-1
4—3.
Processor Section
............................
4-1
4-3. Processor Section
............................
4-1
4-4. UUT Interface Section
........................
4-4
4-5.
Timing Section
..............................
4-4
4-6.
UUT Power Sensing
..........................
4-5
4-7.
DETAILED BLOCK
DIAGRAM DESCRIPTION
. . . .
4-5
4—8.
Processor
Section
............................
4-5
4—9.
UUT Interface Section
7
General
................
4—8
4-10. UUT Interface Section
7
Data
Lines
.............
4—9
4-11. UUT Interface Section
—
Address Lines
...........
4-12
4-12. UUT Interface Section
7
Status
and Control Lines
.
.
4—12
4-13.
Timing Section
..............................
4-13
MAINTENANCE
....................................
5—1
5—1.
INTRODUCTION
.............................
5—l
5—2.
SELF TEST
..................................
5-1
5-3.
REPAIR PRECAUTIONS
......................
5—4
5—4.
TROUBLESHOOTING
.........................
5-4
5-5.
Introduction
................................
5—4
5—6.
Pod Defective or Inoperative?
...................
5—5
5—7.
Selecting a UUT for Pod Testing
.................
5-7
5—8.
Troubleshooting a Defective Pod
.................
5—8
5-13.
Troubleshooting an Inoperative Pod
..............
5-14
5-l4.
DISASSEMBLY
..............................
5-19
ii
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