Product description
Ceraphant PTC31B, PTP31B, PTP33B IO-Link
12
Hauser
change in capacitance is measured at the electrodes of the ceramic substrate and the
process isolating diaphragm. The measuring range is determined by the thickness of the
ceramic process isolating diaphragm.
Devices with metallic process isolating diaphragm
The process pressure deflects the metal process isolating diaphragm of the sensor and a fill
fluid transfers the pressure to a Wheatstone bridge (semiconductor technology). The
pressure-dependent change in the bridge output voltage is measured and evaluated.
Содержание Ceraphant PTP31B
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