I.L. 40-385.1B
(5/92)
1-5
The failure modes, represented by their correspond-
ing bits (zero thru 5), are shown in the value field if
the “Test” mode is selected by the “Display Select”
pushbutton.
• Bit 0 External RAM Failure
• Bit 1 EEPROM Warning
• Bit 2 ROM (EPROM) Failure
• Bit 3 EEPROM Failure (Non-Volatile memory)
• Bit 4 Analog Input Circuit Failure
• Bit 5 Microprocessor Failure
All bits are expressed in a HEX byte form. For ex-
ample, if the display shows “Test 1B”, whose binary
representation is 00011011, this means that the re-
lay failed the self-test in the area of External RAM
(bit 0), EEPROM (one-out-of-three failure, bit 1), EE-
PROM (two-out-of-three failure, bit 3) and Analog In-
put Circuit (bit 4). Normally, the test mode should
show “Test 0", meaning that the relay passed the
self-test routines.
1.7
UNIQUE REMOTE COMMUNICATION
(WRELCOM) PROGRAM
Two optional types of remote interface can be or-
dered.
• RS232C-for single point computer communica-
tion.
• INCOM-for local network communication.
A special software (WRELCOM) program is provid-
ed for obtaining or sending the setting information
to the MDAR. The MDAR front panel shows two fault
events (last and previous), but thru the remote com-
munication, 16 fault events and 16 records of inter-
mediate target data can be obtained and stored.
Each record of the intermediate target data contains
8-cycle information (1-prefault and 7 post-fault), with
7 analog inputs and 24 digital data (at the sampling
rate of 8 per cycle). Refer to WRELCOM manual for
detailed information.
Содержание REL-300
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Страница 116: ...I L 40 385 1B 6 14 5 92 Figure 6 1 Test Connection for Single Phase to Ground Faults Sheet 1 of 4...
Страница 117: ...I L 40 385 1B 5 92 6 15 Figure 6 2 Test Connection for Three Phase Faults 1502B51 Sub 1 Sheet 2 of 4...
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Страница 135: ...I L 40 385 1B SD 6 5 92 Figure SD 2 MDAR Block Diagram sheet 1 of 1 Sub 1 1611C12...