2.3.3.1 Measurement Definitions
The following measurements are displayed within the results screens.
The definitions are listed in alphabetical order. Each measurement is
proprietary to its screen; i.e., ‘error’ refers to E-Bit errors in the E-BIT
screen, and to all Summary errors in the SUMMARY screen.
AISS
: Count of the number of Alarm Indication Signal Seconds.
AS
: Count of Available Seconds since the start of the test. It equals
the length of the total test time minus any Unavailable Seconds.
%AS
: Percentage of Available Seconds since the start of the test.
BIT
: Count of Bit errors since the start of the test. Bit errors are
not counted during unavailable time.
BER
: Bit Error Rate is the total number of bit errors divided by
the total number of bits during the available time since the start
of the test.
CLK SLIP
: Number of Clock Slips since the start of the test.
CODE
: Count of the number of line Code errors (Bipolar Violations
that violate the coding rules) since the start of the test. This is mea-
sured only in E1 mode. In HDB3 coding, a Code Error is a bipolar
violation that is not part of a valid HDB3 substitution. CODE RATE is
the Average Bipolar Violation error rate since the start of the test.
CRC
: Count of the number of CRC-4 block errors since the start of
the test. N/A is displayed when the test set is not synchronized on a
received CRC-4 check sequence. CRC RATE is the average CRC-4
block error rate since the start of the test. N/A is displayed when the
test set is not synchronized on a received FAS or MFAS signal.
DGRM
: Count of Degraded Minutes since the start of the test.
This occurs when there is a 10
-6
bit error rate during 60 available,
non-severely bit errored seconds.
%DGRM
: Percentage of summary Degraded Minutes since the
start of the test.
EBIT
: Number of E-bit errors since the start of the test.
EBER
: Average E-bit error rate since the start of the test.
EFS
: Number of Error Free Seconds since the start of the test.
%EFS
: Percentage of summary Error Free Seconds since the start
of the test. A summary Error Free Second is a second in which the
signal is properly synchronized and no errors or defects occur.
ES
: Count of the number of Errored Seconds since the start of the
test. An ES is any second with at least one BPV, bit error, FBE, er
-
rored block, or CRC-4 error. An ES is not counted during a UAS.
%ES
: Percentage of errored seconds since the start of the test.
MTT-14B e_Manual D07-00-083P RevA00
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