SBAS686 – JULY 2015
Electrical Characteristics (continued)
Minimum and maximum specifications are at T
A
= –40°C to 125°C. Typical specifications are at T
A
= 25°C.
AVDD = 5 V, DVDD = 3 V, V
REF
= 4.096 V (internal), and f
SAMPLE
= 500 kSPS, unless otherwise noted.
TEST
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
LEVEL
(1)
SYSTEM PERFORMANCE
Resolution
18
Bits
A
NMC
No missing codes
18
Bits
A
DNL
Differential nonlinearity
–0.99
±0.5
2
LSB
(3)
A
INL
Integral nonlinearity
(4)
–5
±1.5
5
LSB
A
E
G
Gain error
At T
A
= 25°C, all input ranges
±0.02
±0.05
%FSR
(5)
A
Gain error matching
At T
A
= 25°C, all input ranges
±0.02
±0.05
%FSR
A
(channel-to-channel)
Gain error temperature drift
All input ranges
1
4
ppm/°C
B
At T
A
= 25°C,
±0.5
±1
A
input range = ±2.5 × V
REF
(6)
At T
A
= 25°C,
±0.5
±1
A
input range = ±1.25 × V
REF
At T
A
= 25°C,
E
O
Offset error
±0.5
±1.5
mV
A
input range = ±0.625 × V
REF
At T
A
= 25°C,
±0.5
±2
A
input range = 0 to 2.5 × V
REF
At T
A
= 25°C,
±0.5
±2
A
input range = 0 to 1.25 × V
REF
At T
A
= 25°C,
±0.5
±1
A
input range = ±2.5 × V
REF
(6)
At T
A
= 25°C,
±0.5
±1
A
input range = ±1.25 × V
REF
Offset error matching
At T
A
= 25°C,
±0.5
±1.5
mV
A
(channel-to-channel)
input range = ±0.625 × V
REF
At T
A
= 25°C,
±0.5
±2
A
input range = 0 to 2.5 × V
REF
At T
A
= 25°C,
±0.5
±2
A
input range = 0 to 1.25 × V
REF
Offset error temperature drift
All input ranges
1
3
ppm/°C
B
SAMPLING DYNAMICS
t
CONV
Conversion time
825
ns
A
t
ACQ
Acquisition time
1175
ns
A
Maximum throughput rate
f
S
500
kSPS
A
without latency
(3)
LSB = least significant bit.
(4)
This parameter is the endpoint INL, not best-fit INL.
(5)
FSR = full-scale range.
(6)
Does not include the shift in offset over time.
Copyright © 2015, Texas Instruments Incorporated
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