Appendix B: Parameter Settings
3 in 24
: Three ones in 24 bits (0100 0100 0000 0000 0000 0100), used
to stress AMI lines and clock recovery.
DS1-Only BERT Patterns
1:7, 1in8
: Used for stress testing AMI & B8ZS lines (0100 000).
3 in 24
: Three ones in 24 bits (0100 0100 0000 0000 0000 0100), used
to stress AMI lines.
All-1’s
: All data content is 1’s (1111). In unframed mode this is
interpreted as AIS.
All-0’s
: All data content is 0’s 0000.
Alt, 1:1
: Alternating 1 and 0 (1010).
Auto
: Automatically identi
fi
es and synchronizes to the incoming BERT
pattern.
Daly
: A pattern that obeys pulse density and consecutive zeros rules in
both AMI and B8ZS coding.
B-Tap
(bridge tap): A sequence of patterns that emulates speci
fi
c
frequencies on a T1 line. DS1 only. The patterns and sequence are all
1’s, 1:1, 1:3, 1:5, 1:6, 1:7, 2:8, 2:9, 2:10, 2:11, 2:12, 2:13, 2:14, 3in18,
3in19, 3in20, 3in21, 3in22, 3in23, 3in24, and QRSS.
NOTE.
B-tap is rarely used in loopback scenarios and can not be run
end-to-end with another test set.
2047
: A 2,047 Bit sequence commonly used for 64K DS0 channel
testing (DDS).
1 in 16
: A pattern that violates 1’s density but stresses clock recovery
circuitry.
NetTek YBT100 and YBT100DS3 Backhaul Tester
47
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