Chapter
4
Operating Instructions
UE 440/470
42
© SICK AG • Industrial Safety Systems • Germany • All rights reserved
8 010 432/P097/14-03-05
Configurable functions
4.6.2
Testing of the connected input devices and sensors
To ensure that the connection cables attached to the sensor are in order, a test signal is
fed through the contact and evaluated at the accompanying input. The test pulse does not
affect the function and evaluation of the sensor.
Input devices and sensors configured as N/C contacts
, are tested cyclically. Input
devices and sensors configured as N/O contacts
, are tested as soon as they are
activated (
).
$
Outputs O1.0 and O1.1 are used as test outputs (see Chapter 6 "Electrical installation"
on Page 45).
$
When connecting input devices and sensors to the UE 440/470, ensure that the
required category according to EN 954-1 is complied with. Use test signals, for example,
or cross-circuit detecting or preventative measures.
Context menu device symbol UE 440/470, command
Edit configuration draft…
in
Edit
configuration draft
window, context menu element symbol of the sensor, command
Element wizard…
,
Testing
tab.
4.6.3
Input delay
To mute bounce times of a input device or sensor, you can enter an input delay. For the
settable input delay, refer to the Data sheet on Page 90.
Take the input delay into consideration when switching off the monitored machine or
system!
If the configured input elements effect the OSSDs, (e.g. safety switches which switch off
the OSSDs of the UE 440/470) the response time of the OSSDs increase by the set input
delay (see also Chapter 11.1 "Response times of OSSDs A and B" on Page 86).
Context menu device symbol UE 440/470, command
Edit configuration draft…
in
Edit
configuration draft
window, context menu element symbol of the sensor, command
Element wizard…
,
Input filter
tab.
Fig. 10: Example for the
testing of N/C contacts and
N/O contacts
Notes
!
%
ATTENTION
!
Test pulses
Sensor activated
Test pulses