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Using PEEDI
COUNT
- length in bytes including the spare bytes
Example:
flash test 0 2112*64*4
flash area
Syntax:
flash area add ADDR LENGTH
flash area delete
flash area list
flash area test [markbad]
Description:
Currently implemented only for NAND Flash devices. One or more test regions can be
added and then tested at once. The whole NAND Flash is erased and then the given
region is programmed and verified the with two patterns. At the end the whole device is
erased. The already existing bad blocks will be skipped, but the tested area will be not
expanded. The new detected bad blocks can be marked if the argument ’markbad’ is
applied.
Argument:
ADDRESS
- start address of the region to be tested
COUNT
- length in bytes including the spare bytes
Example:
flash area add 0x00000000 2112*64*4
flash area add 0x00010000 2112*64*6
flash area delete
flash area list
flash area test
flash area test markbad
flash this
PEEDI User’s Manual
142