Measurement Computing Data Translation DT3034, User Manual

Page: 173 / 178

Index
172
C/T 97
D/A output 88
external clock divider
maximum 119
minimum 119
external digital trigger
analog input 80
analog output 89
external negative digital trigger 118
external positive digital trigger 118
externally-retriggered scan mode 78
F
factory service 139
falling-edge gate 98
features 16
analog input 71
analog output 87
counter/timer 96
digital I/O 94
formatting data
analog input 85
analog output 92
frequency
base clock 119
external A/D sample clock 75
external C/T clock 97
internal A/D clock 119
internal A/D sample clock 75
,
119
internal C/T clock 97
,
119
internal D/A output clock 88
internal retrigger clock 77
,
114
frequency measurement 52
,
54
,
102
G
gain
actual available 116
analog input 74
analog output 88
number of 116
programmable 116
gate type 98
falling edge 98
high-edge 120
high-level 120
internal 120
logic-high level 98
logic-low level 98
low-edge 120
low-level 120
none (software) 98
rising edge 98
generating continuous pulses 103
H
help, online 59
high-edge gate type 98
,
120
high-level gate type 120
high-to-low pulse output 99
Host Block Overflow error 86
hysteresis 80
,
90
I
inhibiting data from channels 72
inprocess buffers 114
input configuration
differential analog 45
pseudo-differential analog 45
single-ended analog 45
Input FIFO Overflow error 86
input ranges 74
inserting the board 29
internal clock 119
A/D sample 75
C/T 97
cascaded C/T 97
D/A output 88
internal gate type 120
internal retrigger clock 77
J
J1 connector pin assignments 154
DT740 screw terminal panel 43
,
158
J2 connector pin assignments 156
DT740 screw terminal panel 44
,
159
jumper W1
DT740 36
L
LabVIEW 18
layout
DT740 36
level gate type
high 98
low 98
lines, digital I/O 72
,
94