Measurement Computing Data Translation DT3034, User Manual

Page: 170 / 178

169
Index
A
A/D Over Sample error 86
A/D sample clock 74
external 75
internal 75
A/D subsystem 71
specifications 142
A/D Trigger Out signal 77
,
78
,
79
about-trigger acquisition mode 84
,
113
abrupt stop
analog input 76
analog output 90
accessories 19
acquisition modes
about-trigger 84
post-trigger 81
pre-trigger 82
aliasing 75
analog input channel configuration
differential 45
pseudo-differential 45
single-ended 45
analog input features 71
A/D sample clock 74
calibrating 125
channel list 72
channels 71
continuous operations 76
conversion modes 76
data format 85
error conditions 86
gains 74
input ranges 74
resolution 71
single-value operations 76
specifications 142
trigger acquisition modes 81
trigger sources 79
analog output features 87
calibrating 130
channel list 88
channels 87
continuous operations 90
conversion modes 90
D/A output clock 88
data format and transfer 92
error conditions 93
gains 88
output ranges 88
resolution 87
single-value operations 90
specifications 145
trigger sources 89
analog threshold trigger 80
,
90
,
108
analog input channel 80
,
90
,
108
external 80
,
89
application wiring
connecting analog outputs 50
connecting counter/timer signals 52
connecting current loop analog inputs 49
connecting differential analog inputs 46
connecting digital I/O signals 51
connecting event counting signals 52
,
54
connecting externally cascaded counter/timers
56
connecting pseudo-differential analog inputs 46
connecting pulse output signals 55
connecting single-ended analog inputs 45
attaching the DT740 35
B
banks (digital I/O) 94
base clock frequency 119
BaseClockFrequency 119
bias return resistors
DT740 37
binary data encoding 115
bipolar signals 74
block diagram 70
buffers 90
,
92
,
114
inprocess flush 114
single wrap mode 114
bus mastering, PCI 86
bus slave, PCI 92
C
C/C++ programs 18
C/T clock sources 96
cascaded C/T clock 97
external C/T clock 97
internal C/T clock 97
Index