TEST ACCESS PORT (TAP)
E
6-8
8/26/97 1:10 PM CH06.DOC
INTEL CONFIDENTIAL
(until publication date)
controller state.” In the implementation of RUNBIST used in the P6 family, the execution of
the BIST routine will not stop if the Run-Test/Idle state is exited before BIST is complete. In
all other regards, RUNBIST instruction operates exactly as defined in the 1149.1
specification.
Note that RUNBIST will not function when the processor core clock has been stopped. All
other 1149.1-defined instructions operate independently of the processor core clock.
The op-codes are 1149.1-compliant, and are consistent with the Intel-standard op-code
encodings and backward-compatible with the Pentium processor 1149.1 instruction op-codes.
6.4.
DATA REGISTER SUMMARY
Table 6-2 gives the complete list of test data registers which can be accessed through the
TAP. The MSB of the register is connected to TDI (for writing), and the LSB of the register
is connected to TDO (for reading) when that register is selected.
Table 6-2. TAP Data Registers
TAP Data Register
Size
Selected by Instructions
Bypass
1
BYPASS, HIGHZ, CLAMP
Device ID
32
IDCODE
BIST Result
1
RUNBIST
Boundary Scan
159
EXTEST, SAMPLE/PRELOAD
6.4.1.
Bypass Register
The Bypass register provides a short path between TDI and TDO. It is loaded with a logical 0
in the Capture-DR state.
6.4.2.
Device ID Register
The Device ID register contains the processor device identification code in the format shown
in Table 6-3. The manufacturer’s identification code is unique to Intel. The part number code
is divided into four fields: V
CC
(2.8V supply), product type (an Intel Architecture compatible
processor), generation (sixth generation), and model. The version field is used for stepping
information.
Summary of Contents for Pentium II
Page 1: ...D Pentium II Processor Developer s Manual 243502 001 October 1997 1997...
Page 11: ...E 1 Component Introduction...
Page 12: ......
Page 17: ...E 2 Micro Architecture Overview...
Page 18: ......
Page 33: ...E 3 System Bus Overview...
Page 34: ......
Page 45: ...E 4 Data Integrity...
Page 46: ......
Page 51: ...E 5 Configuration...
Page 52: ......
Page 62: ......
Page 63: ...E 6 Test Access Port TAP...
Page 64: ......
Page 75: ...E 7 Electrical Specifications...
Page 76: ......
Page 106: ......
Page 107: ...E 8 GTL Interface Specifications...
Page 108: ......
Page 129: ...E 9 Signal Quality Specifications...
Page 130: ......
Page 136: ......
Page 137: ...E 10 Thermal Specifications and Design Considerations...
Page 138: ......
Page 149: ...E 11 S E C Cartridge Mechanical Specifications...
Page 150: ......
Page 173: ...E 12 Boxed Processor Specifications...
Page 174: ......
Page 185: ...E 13 Integration Tools...
Page 186: ......
Page 202: ......
Page 203: ...E 14 Advanced Features...
Page 204: ......
Page 206: ......
Page 207: ...E A Signals Reference...
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