Bit
Description
4
DDR uncorrectable error test
5
IBUF uncorrectable error test
6
Capacitor test
7
Blank block test: insufficient blank blocks
8
Life test
9
NOR patrol test
10
Firmware uncorrectable error test: four invalid firmware backups
11
System area test too many bad blocks in the NAND system area
12
Bad block test: too many bad blocks in the NAND data area
13
Controller test: invalid controller
14
Power down fast interrupt request (FIQ) test
15
Formatting failure test
16
DB poweron fail test
17
Reserved
18
Lbn miss happen test
19
Deep rebuild happen Test
24:20
Reserved
25
1
: Firmware needs to be upgraded to restore SSD disks.
26
1
: Data loss risks exist.
27
1
: SSD disks can be restored, but risks exist.
28
1
: SSD disks can be restored.
29
1
: Forcibly restore SSD disks so that the SSD disks can function properly.
30
1
: Restart or power on and then off SSD disks to restore SSD disks.
31
1
: The fault cannot be rectified. Contact Huawei support engineers.
A.6.2.1.8 Obtaining the DIEID of a Chip
This command is used to obtain the DIEID, which is the unique identifier of a chip and is
used to track and manage information of the entire lifecycle (including chip manufacturing,
chip test, board processing, server test, and live network operation).
This command uses the PRP1, PRP2, Dword10, and Dword12 fields. Enter reserved value 0
for fields that are not involved.
ES3000 V5 NVMe PCIe SSD
User Guide
A Supported NVMe Commands
Issue 07 (2019-03-19)
Copyright © Huawei Technologies Co., Ltd.
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