Bit
Description
9
NOR patrol test
10
Firmware uncorrectable error test: four invalid firmware backups
11
System area test too many bad blocks in the NAND system area
12
Bad block test: too many bad blocks in the NAND data area
13
Controller test: invalid controller
14
Power down fast interrupt request (FIQ) test
15
Formatting failure test
16
Db poweron fail test
17
Reserved
18
Lbn miss happen test
19
Deep rebuild happen Test
24:20
Reserved
25
1
: Firmware needs to be upgraded to restore SSDs.
26
1
: Data loss risks exist.
27
1
: SSDs can be restored, but risks exist.
28
1
: SSDs can be restored.
29
1
: Forcibly restore SSDs so that the SSDs can function properly.
30
1
: Restart or power on and then off SSDs to restore SSDs.
31
1
: The fault cannot be rectified. Contact Huawei support engineers.
A.6.1.1.8 Obtaining the DIEID of a Chip
This command is used to obtain the DIEID, which is the unique identifier of a chip and is
used to track and manage information of the entire lifecycle (including chip manufacturing,
chip test, board processing, server test, and live network operation).
This command uses the PRP1, PRP2, Dword10, and Dword12 fields. Enter reserved value 0
for other fields that are not involved.
Table A-35
Sub_OpCode
Sub_OpCode
Description
0x240009h
Obtain the chip DIEID.
ES3000 V5 NVMe PCIe SSD
User Guide
A Supported NVMe Commands
Issue 07 (2019-03-19)
Copyright © Huawei Technologies Co., Ltd.
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