Making
a
Measurement
Connection
to
Device
Under
T
est
(DUT)
T
o
Make
Connections
to
Reduce
Leakage
Current
Connect
the
terminals
of
the
connector
plate
to
the
probing
needles
by
using
coaxial
cables
.
Connect
coaxial
center
conductor
to
force
terminal
(of
connector
plate)
and
tail
of
the
probing
needle
.
Connect
coaxial
outer
conductor
to
guard
terminal
(of
connector
plate).
T
o
reduce
the
leakage
current,
extend
the
guard
conductor
as
close
as
possible
to
the
DUT
.
W
A
R
N
I
N
G
Do
not
touch
the
guard
terminal
with
bare
hands
because
you
may
be
shocked
by
high
voltage
.
The
potential
of
the
guard
terminal
is
equal
to
the
output
voltage
.
C
A
U
T
I
O
N
Never
connect
the
guard
terminal
to
any
other
output,
including
circuit
common,
frame
ground,
or
the
guard
terminal
of
any
other
unit.
Doing
so
may
damage
the
unit.
Example
The
following
example
connection
can
be
used
to
reduce
the
leakage
current.
Extend
the
outer
conductor
as
close
as
possible
to
the
probing
needle
.
This
also
reduces
the
induced
noise
.
3-6
Summary of Contents for 4155A
Page 2: ...Semiconductor Parameter Analyzer User s Task Guide ...
Page 6: ......
Page 7: ......
Page 8: ......
Page 9: ......
Page 19: ...Contents ...
Page 20: ...1 Introducing the HP 4155A 4156A ...
Page 47: ...Introducing the HP 4155A 4156A An Overview of Functions ...
Page 48: ...2 Installation ...
Page 84: ...Installation Installing Accessories Attaching HP 16441A R Box to Shielding Box 2 37 ...
Page 94: ...3 Making a Measurement ...
Page 161: ...Making a Measurement Stress Force ...
Page 162: ...4 Analyzing Measurement Results ...
Page 206: ...5 Filer ...
Page 211: ...Filer File Operations Example The following gure shows example that displays le catalog 5 6 ...
Page 233: ...Filer File Operations ...
Page 234: ...6 If Y ou Have A Problem ...
Page 276: ...7 Manual Changes Depending on ROM Version ...
Page 279: ...Manual Changes Depending on ROM Version Change 1 ...