If
Y
ou
Have
A
Problem
When
Y
ou
Make
A
Measurement
If
Measured
V
alue
Oscillates
when
Measuring
High-
Frequency
Devices
When
measuring
parameters
of
high-frequency
devices
,
such
as
GaAs
MESFET
s
or
high-frequency
bipolar
transistors
,
oscillation
may
cause
measurement
problems
.
Normal
measurement
cannot
be
performed
because
of
oscillation.
T
o
solve
this
problem:
F
or
FET
s
,
add
resistive
ferrite
beads
as
close
as
possible
to
the
gate
.
F
or
bipolar
transistors
,
add
resistive
ferrite
beads
as
close
as
possible
to
the
base
or
emitter
.
Make
connection
cables
as
short
as
possible
.
Long
wires
cause
oscillation
because
of
their
large
inductance
.
6-9
Summary of Contents for 4155A
Page 2: ...Semiconductor Parameter Analyzer User s Task Guide ...
Page 6: ......
Page 7: ......
Page 8: ......
Page 9: ......
Page 19: ...Contents ...
Page 20: ...1 Introducing the HP 4155A 4156A ...
Page 47: ...Introducing the HP 4155A 4156A An Overview of Functions ...
Page 48: ...2 Installation ...
Page 84: ...Installation Installing Accessories Attaching HP 16441A R Box to Shielding Box 2 37 ...
Page 94: ...3 Making a Measurement ...
Page 161: ...Making a Measurement Stress Force ...
Page 162: ...4 Analyzing Measurement Results ...
Page 206: ...5 Filer ...
Page 211: ...Filer File Operations Example The following gure shows example that displays le catalog 5 6 ...
Page 233: ...Filer File Operations ...
Page 234: ...6 If Y ou Have A Problem ...
Page 276: ...7 Manual Changes Depending on ROM Version ...
Page 279: ...Manual Changes Depending on ROM Version Change 1 ...