Hinds Instruments Exicor Gen5, User Manual, Page: 91 / 98

Exicor GEN5 User Manual 81
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Technical Specifications
Power Requirements
The Exicor GEN5 has been configured for the power connections of the customer’s
factory and is designed to operate on the following:
115/230V ~, 9/4A, 50/60Hz
General Description
Exicor GEN5 is an integrated system for measuring low-level strain birefringence in
thin, optically transparent samples up to 1100mm x 1300mm. An extensive system-
specific software program provides the following:
•
Graphical user interface
•
Automated and manual motion control of measurement modules
•
Automated data collection and analysis of samples
•
On-screen graphing of sample data or measurement data files; printable
display
•
Automatic calibration check, system initialization, and system status
monitoring
Specifications
Measurement Capability
Retardation units: nm or nm/cm
Differential Stress units: psi
Wavelength: 633 nm
Retardation range: 0 – 120 nm
Retardation repeatability
(1)
: ±0.01 nm (Re ≤ 1nm) or ± 1% (Re > 1nm)
Background Noise level
(2)
: 0.1 nm (without sample)
Angular repeatability
(1)
: ±0.5° at Re > 1 nm)
Measurement time: ~ 1.5 s per data point (depends on step size)