Fluke ScopeMeter 123, Service Manual, Page: 29 / 96

Characteristics
2.11 EMC Immunity
2
2-15
2.11 EMC Immunity
The Fluke 123/124/125, including standard accessories, conforms with the EEC directive
89/336 for EMC immunity, as defined by IEC1000-4-3, with the addition of tables 2-1 to
2-3.
Trace Disturbance with STL120
See Table 2-1 and Table 2-2.
Table 2-1. No Visible Trace Disturbance
No visible disturbance E= 3 V/m E= 10 V/m
Frequency range 10 kHz to 27 MHz
Frequency range 27 MHz to 1 GHz 100 mV/div to 500 V/div
100 mV/div to 500 V/div 500 mV/div to 500 V/div
100 mV/div to 500 V/div
Table 2-2. Trace Disturbance < 10%
Disturbance less than 10% of full scale E= 3 V/m E= 10 V/m
Frequency range 10 kHz to 27 MHz
Frequency range 2 MHz to 1 GHz 20 mV/div to 50 mV/div
10 mV/div to 20 mV/div 100 mV/div to 200 mV/div
-
(-): no visible disturbance
Test tool ranges not specified in Table 2-1 and Table 2-2 may have a disturbance of more than 10% of full
scale.
Multimeter disturbance
See Table 2-3.
•
VDC, VAC, and VAC+DC with STL 120 and short ground lead
•
OHM, CONT, DIODE, and CAP with STL120 and black test lead to COM
Table 2-3. Multimeter Disturbance < 1%
Disturbance less than 1% of full scale E= 3 V/m E= 10 V/m
Frequency range 10 kHz to 27 MHz
VDC, VAC, VAC+DC
OHM, CONT, DIODE
CAP
500 mV to 1250V
50
Ω
to 30 M
Ω
50 nF to 500
μ
F
500 mV to 1250V
500
Ω
to 30 M
Ω
50 nF to 500
μ
F
Frequency range 27 MHz to 1 GHz
VDC, VAC, VAC+DC
OHM, CONT, DIODE
CAP
500 mV to 1250V
50
Ω
to 30 M
Ω
50 nF to 500
μ
F
500 mV to 1250V
500
Ω
to 30 M
Ω
50 nF to 500
μ
F
Test tool ranges not specified in Table 2-3 may have a disturbance of more than 10% of full scale.