Agilent Technologies 71501D, User Manual

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Index-4
Index
markers turned on , 2-13
markers, menus , 3-13
MARMSK command , 4-9
mask align , 3-32
mask and limit lines , 1-8
mask margins , 3-32
mask or limit line creation , 2-24
mask or limit line editing , 2-24
mask setup menu , 3-33
mask testing
applying , 3-31
modes available , 1-5
masks and limit lines , 3-9
masks and limit lines description , 3-9
masks displayed on screen , 3-9
masks, menus , 3-13
mass storage , 3-34
mass storage, menus , 3-13
matching delay between channels , 3-63
mean fall time description , 3-5
mean rise time description , 3-5
MEAS command , 4-10
measure in optical power units , 3-16
measure, menus , 3-13
Measurement Conditions , 1-22
measurement plane , 1-10 , 1-26
measurements
definitions , 3-4
extinction ratio , 2-6 , 2-12
fast amplitude and phase transitions , 3-5
in optical power units , 3-16
laser turn-on delay , 2-13
optical power units , 2-8
memory
selecting and formatting , 3-34
memory card
battery , 3-39
duplicate , 3-41
loading personality , 1-18
memory card, formatting , 3-37
memory cards , 3-34
menus
70820A , 3-14
Agilent 70820A , 3-14
averaging , 3-27
calibration , 3-62
eye-diagram , 3-12
histogram , 3-7
left-side , 3-15
maps , 3-12
mask setup , 3-33
module main , 1-17
persistence , 3-28
setup and trg and cal , 3-12
setup and trg, cal , 3-12
traces, measure, markers, masks, and mass
storage menus , 3-13
traces, measure, markers, masks, storage , 3-
13
user-correction , 3-51
mode selection , 1-22
modes, features , 1-5
monochrome grading persistence , 3-29
monochrome persistence , 3-28
move the measurement plane , 1-26
N
number of bits displayed , 3-16
O
offset calibration , 2-5
optical power units , 3-16
optical power units display , 3-16
optical power units measurement , 2-8
optimum performance , 3-6
outline, setting up eye-diagram , 1-4
overshoot resulting from laser bias , 2-5
P
pass/fail testing , 1-8
pattern display , 2-27
pattern generator settings , 1-23
pattern generator, 70841A/B , 1-24
pattern mode , 1-8
pattern modes , 1-5
performing self-test , 3-69
PERSIST command , 4-11
persistence modes , 3-27
personality loading , 1-16
plotting , 3-48
position and scale each trace , 3-26
preset state , 1-26
preview programming commands , 3-20