Sun Microelectronics
334
UltraSPARC User’s Manual
D.5.1 Public Instructions
D.5.1.1 BYPASS
Select the BYPASS register as the active test data register.
D.5.1.2 SAMPLE/PRELOAD
Selects the boundary scan register as the active test data register. This instruction
allows for the observing of the I/O pins or shifting in of a value to the boundary
scan chain without disturbing the normal processor operation.
D.5.1.3 EXTEST
Selects the boundary scan register as the active test data register. Used to perform
board level interconnect testing. When active the boundary scan chain drive the
processor pins. Therefore, UltraSPARC cannot operate in its normal functional
mode.
Table D-3
IEEE 1149.1 Instruction Encodings
Instruction
IR encoding
Scan Chain
BYPASS
FF
16
bypass
IDCODE
FE
16
id register
EXTEST
00
16
boundary
SAMPLE
07
16
boundary
INTEST
01
16
boundary
PLLMODE
9F
16
pll mode
CLKCTRL
9D
16
clock control
RAMWCP
BD
16
ram control
POWERCUT
8E
16
N/A
HIGHZ
FD
16
bypass
INTEST2
8F
16
boundary
FULLSCAN
40
16
..7F
16
internal
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