PC-UM10M
SL-5500 HARDWARE DESCRIPTION
– 18 –
<Description buffers>
PCM audio
TIAudo
output-SDF
conversion
circuit
SFRM
1
IN
IBO
Audio serial data start signal
CPU (SA1110)
LRCLK
1
OUT
OB1T
Audio serial data right and left identification
signal
Audio stereo DAC
SCLK
1
IN
IBO
Audio serial data clock signal
CPU (SA1110)
DACSCK
1
OUT
OB1T
Audio serial clock-SCLK inversion
Audio stereo DAC
Subtotal
4
SD_CARD SPI
control circuit
SPICS_B
1
OUT
TB1T
SD_CARD CS signal
SD_CARD connector
SPICLK
1
OUT
TB2T
SD_CARD clock signal
SD_CARD connector
SPIDI
1
IN
IBO
SD_CARD data input signal
SD_CARD connector
SPIDO
1
OUT
TB2T
SD_CARD data output signal
SD_CARD connector
Subtotal
4
S D _ C A R D /
TC35143 AF
clock output
XIN18M
1
IN
LIN
SD_CARD/Toshiba TC35143AF base clock
signal input (18.432 MHz)
Oscillation circuit
(OSC4C)
XOUT18M
1
IN
LOT
SD_CARD/Toshiba TC35143AF base clock
signal input
Oscillation circuit
(OSC4C)
CLK9M
1
OUT
OB2T
Clock signal output (9.216 MHz)
Toshiba TC35143AF,
CPU
Subtotal
3
GPIO port
GPIO[15, 12:3, 0]
16
I/O
BA1T
General-purpose I/O port (CMOS input +
Feed-through current prevention type)
GPIO[14:13, 2:1]
4
I/O
BH1T
General-purpose I/O port (Schmidt input)
TEST circuit
TEST
1
IN
ITST1
Test mode selection signal input
–
Power supply
(3.3 V)
VDD3
7
GND
8
TOTAL_PIN
128
QFP15 (14 x 14 x 1.4mm)
Function
Pin name
Pin No.
Q'ty
I/O
Buffer
Description
Connected to
IBC
: Input buffer
IBH
: Schmidt trigger input buffer
IBO
: OR type gated input buffer
IBOP2
: OR type gated input 100 K pull-up
OB1T
: Output buffer (IOL=2mA, with test function)
OB2T
: Output buffer IOL=6mA, with test function)
TB1HT : 3-state output buffer with buss hold circuit (IOL=2mA, with test function)
OD1T
: Open drain output buffer (IOL=2mA, with test function)
TB1T
: Try state output buffer (IOL=2mA, with test function)
TB2T
: Try state output buffer (IOL=6mA, with test function)
BG1
: 5-V withstand voltage output buffer (IOL=2mA, with test function)
BH1T
: Schmidt trigger I/O buffer (IOL=2mA, with test function)
BA1T
: AND type gated I/O buffer (IOL=2mA, with test function)
BA2T
: AND type gated I/O buffer (IOL=6mA, with test function)
LIN
: TRANSPARENT input buffer (for clock oscillation)
LOT
: TRANSPARENT output buffer (for clock oscillation)
ITST1
: Test mode input buffer (with pull-down)