BG 805 981 BE (0201) QMG422.oi
43
SEM+FIL
Control of filament and SEM supply
INTERN
Control with CS 422 or interface.
EXTERN
Control with EXT-PROT signal on
ctrl
connector:
•
Contact open: SEM+FIL switched off.
•
Contact closed: SEM+FIL switched on.
EXT-PROT
Switch-off with EXT-PROT signal on
ctrl
connector:
•
Contact open: Switch-off and inhibition of switch-on.
•
Contact closed: Enables switching on SEM+FIL via CS 422 or
interface.
Global SEM high voltage. It is valid for all measurement channels for which no
individual setting has been defined with detect-SEM:SEM-HV.
SEM-VOLTAGE
Not with
config-SYSTEM-DETECT:FARAD
0 ... 3500 V
Global SEM high voltage
With High SEM (
config-SYSTEM-DETECT:H-SEM
) the minimum value is 750 V
→
18
See TEST
See DIG-OUT
See FIL1, FIL2
SIMUL
Simulation spectrum for test purposes (
→
48).
OFF
Simulation switched off.
INTERN
Simulation via QC internal measurement path.
EXTERN
Simulation via QC external connection. Only for factory use, additional
hardware required.
If no error message exists the warning SIMULATION is displayed.
Speed for mass scan
SPEED
Not with
mass-MODE:SAMPLE
or
detect-TYPE:PIRANI, PENNING, A-INPUT
0.5, 1, 2, 5, 10, 20, 50 ms/u
0.1, 0.2, 0.5, 1, 2, 5, 10, 20, 60 s/u
With detect-TYPE:FARAD, SEM, EXTERN
and
amplif-MODE:FIX
10 ms/u ... 60 s/u
With detect-TYPE:FARAD, SEM, EXTERN
and
amplif-MODE:AUTO, AUTO-D
2 ms/u ... 60 s/u
With
detect-TYPE:ION-CNT
and
mass-MODE:STAIR
20 ms/u ... 60 s/u
With
detect-TYPE:ION-CNT
and
mass-MODE:SCAN
and
PEAK
STATE
Enable or skip a channel in multichannel mode
SKIP
Skip channel.
ENABLE
Measure channel.
Reduces the number of measured values/u transmitted via the interface with mass-
MODE:SCAN to ½ or ¼; this parameter can only be operated via the interface.
From the system configuration defined here the unit determined the possible
operating modes and parameter sets.
Expansion with bus modules is detected automatically by the unit.
See sub menus
QMA, MASS-R, IS-TYP, DETECT, OPTION.
Test and alignment programs for service purposes.
The individual tests are initiated with the soft keys, endless tests are terminated
with
del
. During a test the word BUSY is displayed, the result in shown in the status
line for approximately ten seconds.
SEM+FIL (config-CTRL)
SEM-VOLTAGE (sem hv)
SERVICE (config)
SET (di/do)
SET (ion src)
SIMUL (config)
SPEED (mass)
STATE (aux)
STEPS
SYSTEM (config)
TEST (config)