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SPECTANO 100 User Manual
13.6.4 Correction procedure
Electrode systems with guarding and suitable connections ensure a precise measurement by shunting
edge currents from spurious external voltages away from the measuring circuit. This reduces the
probability of a measurement error significantly. In theory the edge capacitances c
e
are zero.
Nevertheless, stray capacitances of the test cell or between the leads and to ground are not shunted.
The presence of such capacitances could still influence the measurement accuracy, for example, of thin
samples (µm range). We recommend to
•
Perform a standardized air reference measurement using the SPECTANO Analyzer Suite
•
Activate the correction to display the corrected capacitance and relative permittivity ε
r
values.
For more information about the air reference correction and its equations read chapter 10.4
Perform reference measurements.
13.7 Cylindrical electrode without Guard ring
13.7.1 IEC standards
According to the IEC standards for the analysis of dielectric and resistive properties of solid and liquid
insulating materials
•
IEC 60250-1969: AC methods for solid insulating material analysis
•
IEC 60247-2004: AC methods for liquid insulating material analysis
•
IEC 62631-3-1-2017-03: DC methods for solid insulating material analysis
you can use a Cylindrical electrode test cell without Guard ring for AC and DC method analysis.
IEC 60250-1969 is replaced by IEC 62632-2-1-2018-2. The following table describes the differences
between these two standards:
Table
7
13-9
9
Differences between IEC 60250-1969 and IEC 62632-2-1-2018-02
IEC 60250-1969
IEC 62632-2-1-2018-02
Frequency
range
15 Hz to 300 MHz
0.1 Hz to 10 MHz
Test cell
types
Disk electrode with Guard ring
Disk electrode without Guard ring
Cylindrical electrode with Guard ring
Cylindrical electrode without Guard ring
etc.
Disk electrode with
Guard ring
In comparison to IEC 60250, the latest IEC standards such as IEC 62632-2-1-2018-02 base on the
demands on different frequency ranges.
Cylindrical test cell types are not described anymore in the latest IEC standard for the analysis of
dielectric properties of solid insulating materials.