NXP Semiconductors SAFE ASSURE FRDMGD3162HBIEVM, Руководство пользователя, Страница: 9 / 43

NXP Semiconductors
UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Pin Name Function
15 INTAL fault reporting and real time V
CE
and VGE monitoring (low side)
16 MOSIH master out slave in (high side)
17 INTAH fault reporting and real time V
CE
and VGE monitoring (high side)
18 CSBH chip select bar (high side)
19 LED_PWR USB 3.3 V power for INTB LEDs (high side and low side)
20 AOUTH duty cycle encoded signal (high side)
21 PWMH PWM input (high side)
22 FSSTATEH fail-safe state (high side)
23 GND ground
24 INTBH interrupt bar (high side)
Table 2. Low-voltage domain 24-pin connector definitions
...continued
4.4.2 Test point definitions
All test points are clearly marked on the evaluation board. Figure 4 shows the location of
various test points.
Figure 4. Key test point locations
UM11729 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
User manual Rev. 1 — 21 February 2022
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