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NXP Semiconductors
UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
5 Configuring the hardware
FRDMGD3162HBIEVM is connected to compatible SiC MOSFET HybridPACK Drive
module with a DC link capacitor as shown in
. Double pulse and short-circuit
testing can be conducted utilizing Windows based PC with FlexGUI software.
Suggested equipment needed for test:
•
Rogowski coil high-current probe
•
High-voltage differential voltage probe
•
High sample rate digital oscilloscope with probes
•
DC link capacitor compatible with HybridPACK Drive module
•
IGBT or SiC MOSFET HybridPACK Drive module
•
Windows based PC
•
High-voltage DC power supply for DC link voltage
•
Low-voltage DC power supply for VSUP
–
+12 V DC gate drive board low-voltage domain
•
Voltmeter for monitoring high-voltage DC link supply
•
Load coil for double pulse testing
DC link capacitor is not shown
Figure 11. Evaluation board and system setup
UM11729
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© NXP B.V. 2022. All rights reserved.
User manual
Rev. 1 — 21 February 2022
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