NXP Semiconductors SAFE ASSURE FRDMGD3162HBIEVM, Руководство пользователя, Страница: 10 / 43

NXP Semiconductors
UM11729
FRDMGD3162HBIEVM half-bridge evaluation board
Test point Definition
Low-voltage domain
VSUP DC voltage source connection point for VSUP power input of GD3162 devices. Externally supplied 12 V DC
supply voltage. VSUP supplies 5 V regulator for gate drive VDD.
GND grounding points for low-voltage domain
INTAH fault monitor and VCE/VGE real-time report monitor high-side test point
INTBL interrupt bar low-side test point
INTAL fault monitor and VCE/VGE real-time report monitor low-side test point
INTBH interrupt bar high-side test point
Low-side driver domain
GNDL low-side domain ground point
VCCL positive voltage supply test point for isolated circuitry and low-side driver domain
VRFL 5.0 V reference test point for isolated analog circuitry on low-side driver
TSENSEL temperature sense connection low-side test point
GL module gate test point on low-side driver domain which is the charging pin of gate; including MMCX probe
connection
FSISOL high-voltage domain fail-safe low-side test point
DSTL V
CE
desaturation test point connected to low-side driver DESAT pin and circuitry
VEEL negative voltage supply test point for low-side driver gate of IGBT or SiC module
VDC DC link voltage test point at voltage divider
COLL collector test point/connection terminal on low side
High-side driver domain
VCCH positive voltage supply test point for isolated circuitry and high-side driver domain
GNDH high-side domain ground point
COLH collector test point/connection high side
TSENSEH temperature sense connection high-side test point
VRFH 5.0 V reference test point for isolated analog circuitry on high-side driver
FSISOH high-voltage domain fail-safe high-side test point
GH module gate test point on high-side driver domain which is the charging pin of gate; including MMCX probe
connection
DSTH V
CE
desaturation test point connected to high-side driver DESAT pin and circuitry
VEEH negative voltage supply test point for high-side driver gate of IGBT or SiC module
AMXH analog MUX input test point for high-side driver
Table 3. Test point definitions
UM11729 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
User manual Rev. 1 — 21 February 2022
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