Nanosurf easyScan 2 AFM, Руководство по эксплуатации

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P
HASE
C
ONTRAST
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Phase Contrast
The Phase Contrast mode is an extension of the Dynamic Force mode. In
addition to the vibration amplitude, the phase shift between the cantilever
vibration and a reference signal is measured. This phase shift changes when
the resonance characteristic of the cantilever changes due to changes in the
tip-sample interaction. Thus, the Phase contrast mode can be used to pro-
duce material contrast when there is a significant difference in the tip sam-
ple interaction of these materials. This section gives a brief description of
how to operate the easyScan 2 AFM in phase contrast mode. For a more
detailed description of the parameters that you can set, refer to section
The
Operating mode panel (p.95).
The phase contrast mode can also be used to do Magnetic and Electrostatic
Force Microscopy. For more information on how to do Magnetic Force
Microscopy, refer to technical note
TN00031 Magnetic Force Microscopy ,
which can be downloaded from the support section of the Nanosurf web
site at
www.nanosurf.com .
Proceed as follows to operate the easyScan 2 AFM in the Phase Contrast
mode:
For Phase contrast mode, you can use the same cantilevers that you use for
Dynamic force mode.
- Select the Phase Contrast mode in the Operating Mode panel.
To display the measurement results:
- Create a new chart in the Imaging window by clicking in the Chart
bar.
- If necessary, increase the size of the window to make space for the new
chart.
- Select the ‘Color map’ chart type by .
- Select the ‘Phase’ signal by .
The reference phase is usually set automatically after the approach so that
the average phase shift lies in the centre of the measurement range. To auto-
matically readjust the phase shift: