LEM Saturn 100 Plus, Руководство по эксплуатации, Страница: 55 / 329

Information for the tester
53
Nominal
current
I
∆ N (mA)
Measuring range
for RS and RA,
respectively
Resolution
(
Ω
)
Calculation
Operational
intrinsic error
10 1…15 Ω …9,99 k Ω 1...10
30
1…15
Ω
…3,33 k
Ω
1…10
100
0,1…1,5
Ω
...999
Ω 0,1…1
3) 300
0,1…1,5
Ω
…333
Ω 0,1...1
1) 500
0,01…0,15
Ω
…199
Ω 0,01...1
1)2)1000 0,01..0,15 Ω
..9,9
Ω 0,01...1
RA ( RS) =
at
S
:
RA ( RS) =
± (10%v.MW+4 D)
1
) not with U
L-PE
< 152 V, not for 5 x I
∆
N
2
) not for S and 5 x I
∆ N
3
) not for 5 x I
∆
N
4
) can be changed to R=U
L
/2xI
∆
N
at the service centre
Test
Tripping Time
Range (tA
Resolution Intrinsic error
I
∆
N
x 1,
I
∆ N
x 2, S
0 … 500 ms 1 ms ±4 ms
I
∆ N
x 5
150 ms 1 ms
± 4 ms
Ramp 300/500 ms 1 ms
±
4 ms
Measuring time with
tripping test:
2 - 26 (250 + 200) ms
(response time of FI-switch)
with probe:
Probe Voltage Range Resolution Intrinsic error
0,1 – 69,9 V 0,1 V ±
(2 % of m.v. digits)
Internal resistance:
approx. 1,6 M
Ω
Max. probe resistance:
≤
10 k
Ω
Noise voltage:
max. 20 V with respect to PE-potential;
at higher probe voltages no measurement is started.
UL
2x I
∆
N
UL
I
∆
N