Keysight B1505A Configuration and Connection Guide
Contents
3 kV, 20 A, Capacitance Measurement for On-Wafer Lateral Device . . . . . . . . . . . . . 7-30
Add High Resolution Measurement (10 fA resolution with MPSMU or HPSMU)
Capability to 3 kV, 20 A, Capacitance Measurement for On-Wafer Lateral Device . . 7-33
3 kV, 40 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . . . 7-35
3 kV, 500 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . . 7-38
3 kV, 500 A, Capacitance Measurement for On-Wafer Lateral Device . . . . . . . . . . . . 7-40
3 kV, 500 A, High Voltage Medium Current Measurement for On-Wafer
Lateral Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-42
10 kV, 500 A Measurement for On-Wafer Lateral Device. . . . . . . . . . . . . . . . . . . . . . . 7-44
Configuration Examples for Vertical Device Measurement with Wafer Prober. . . . . . . . 7-46
3 kV, 20 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . . 7-47
3 kV, 20 A, Capacitance Measurement for On-Wafer Vertical Device. . . . . . . . . . . . . 7-51
Add High Resolution Measurement (10 fA resolution with MPSMU or HPSMU)
Capability to 3 kV, 20 A, Capacitance Measurement for On-Wafer Vertical Device. . 7-54
3 kV, 40 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . . 7-56
3 kV, 500 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . . 7-59
3 kV, 500 A, Capacitance Measurement for On-Wafer Vertical Device. . . . . . . . . . . . 7-60
3 kV, 500 A, High Voltage Medium Current Measurement for On-Wafer
Vertical Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-62
10 kV, 500 A Measurement for On-Wafer Vertical Device . . . . . . . . . . . . . . . . . . . . . . 7-64
GaN Current Collapse / Dynamic On-Resistance Measurement System
Non-Kelvin Connection with the N1259A Test Fixture for Package Device . . . . . . . . 7-66
Kelvin Connection with the N1259A Test Fixture for Package Device . . . . . . . . . . . . 7-68
Non-Kelvin Connection with Prober for On-Wafer Lateral Device . . . . . . . . . . . . . . . 7-70
Kelvin Connection with Prober for On-Wafer Lateral Device . . . . . . . . . . . . . . . . . . . . 7-72
Содержание B1505A
Страница 1: ...Keysight Technologies B1505A Power Device Analyzer Curve Tracer Configuration and Connection Guide ...
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Страница 9: ...1 Configuration Guide ...
Страница 83: ...2 N1259A Connection Guide ...
Страница 107: ...3 N1265A Connection Guide ...
Страница 132: ...3 26 Keysight B1505A Configuration and Connection Guide N1265A Connection Guide Output Connection ...
Страница 133: ...4 N1272A and N1273A Connection Guide ...
Страница 148: ...4 16 Keysight B1505A Configuration and Connection Guide N1272A and N1273A Connection Guide Output Connection ...
Страница 149: ...5 Connection Guide for Wafer Prober and Your Own Test Fixture ...
Страница 203: ...6 Accessory Dimensions ...
Страница 219: ...7 Connection and Ordering Examples ...
Страница 296: ...7 78 Keysight B1505A Configuration and Connection Guide Connection and Ordering Examples Upgrading from existing B1505A ...
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