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S540 Power Semiconductor Test System Administrative Guide
Section 1: S540 system
S540-924-01 Rev. D / January 2019
1-3
S540 3000 V high-voltage, low-current system configuration options
DC source-measure units (SMU)
Maximum number of units depends on other items in the
system rack
2636B System SourceMeter
®
instrument (quantity: 1 to 4)
2657A High-Power System SourceMeter
®
instrument
(quantity: 2)
6-slot switching matrix
One Model HVM1212A 12 × 12 high-voltage switch matrix and
one Model 707B system switch mainframe with:
Model 7531 switch cards (quantity: 2 to 6, depending on
instruments and number of low-voltage pins in the
system); one card is used as an interconnect card
Optional capacitance/voltage (C-V)
Two channels of C-V (using one Model 4200A-SCS with two
Model 4210-CVU cards)
Optional instruments
Model DMM7510 7-1/2 Digit Graphical Sampling
Multimeter
(quantity: 0 to 1)
Model 4220-PGU dual-channel pulse cards (quantity: 0 to
3)
Frequency measurement option
Included with each system
Computer inside cabinet
External 24-inch flat-panel monitor and keyboard tray
mounted on exterior of cabinet
Keithley Test Environment (KTE) or Automated
Characterization Suite (ACS) system software
LO patch panel
Interlock system
Adjustable cable support arm
Other options
Advanced seismic securement kit for additional resistance to
seismic forces
Optional accessories
Optional items and accessories that may accompany the S540 system:
Cables to connect to the test fixture or the probe card adapter
9140A-PCA probe card adapter (12 3-kV pins to 36 200-V pins) or Celadon Systems
VersaCore
TM
VC20 probe card adapter (12 3-kV pins to 32 200-V pins)
RSA306B USB Spectrum Analyzer
Advanced seismic securement kit