Genie Nano-CL C2450, Руководство пользователя

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Genie Nano-CL Series™ Genie Nano Specifications
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13
Sensor Cosmetic Specifications
After Factory Calibration and/or Corrections are applied (if applicable — dependent on sensor)
Blemish Specifications Maximum Number of
Defects
Blemish Description
Hot/Dead Pixel defects Typical 0.0025%
Max 0.005%
Any pixel that deviates by ±20% from the average of
neighboring pixels at 50% saturation including pixel stuck at 0
and maximum saturated value.
Spot defects none Grouping of more than 8 pixel defects within a sub-area of 3x3
pixels, to a maximum spot size of 7x7 pixels.
Clusters defects none Grouping of more than 5 single pixel defects in a 3x3 kernel.
Column defects none Vertical grouping of more than 10 contiguous pixel defects
along a single column.
Row defects none Horizontal grouping of more than 10 contiguous pixel defects
along a single row.
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Test conditions
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Nominal light = illumination at 50% of saturation
• Temperature of camera is 45°C
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At exposures lower than 0.25 seconds
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At nominal sensor gain (1x)