Atek HP 8753D, Руководство пользователя, Страница: 84 / 677

T esting A Device with Limit Lines
Limit testing is a measurement technique that compares measurement data to constraints that
you dene . Depending on the results of this comparison, the analyzer will indicate if your
device either passes or fails the test.
Limit testing is implemented by creating individual at, sloping, and single point limit lines on
the analyzer display . When combined, these lines can represent the performance parameters
for your device under test. The limit lines created on each measurement channel are
independent of each other .
This example measurement shows you how to test a bandpass lter using the following
procedures:
creating at limit lines
creating sloping limit lines
creating single point limit lines
editing limit segments
running a limit test
Setting Up the Measurement P arameters
1. Connect your test device as shown in Figure 2-35.
Figure 2-35. Connections for S A W Filter Example Measurement
2. Press 4 PRESET 5 and choose the measurement settings . F or this example the measurement
settings are as follows:
4
MEAS
5
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Trans: FWD S21 (B/R)
4
CENTER
5 4
134
5 4
M/
5
4
SP AN
5 4
50
5 4
M/
5
4
SCALE REF
5
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
AUTO SCALE
Y ou may also want to select settings for the number of data points , power , averaging, and IF
bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
4 CAL 5
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
CALIBRATE MENU
NNNNNNNNNNNNNNNNNNNNNNNNNN
RESPONSE
NNNNNNNNNNNNNN
THRU
2-36 Making Measurements