
analyzer
description,
1-2
analyzer
display
measurement
setup
diagram,
3-31
annotations
of
display,
1-7
anti-static
mat,
7-36
application
and
operation
concepts,
6-1
applications
amplier
testing,
6-145{148
mixer
testing,
6-149{160
on-wafer
measurements,
2-76
arrays
exibility,
4-36
format,
6-7
format
,
4-36
raw
data
,
4-36
assign
classes,
5-29,
5-31
atmospheric
conditions,
7-36
A
TN
(attention)
control
line,
11-17
attention
(A
TN)
control
line,
11-17
attenuation
at
mixer
ports,
3-2
attenuator,
6-2
allowing
repetitive
switching,
6-19
switch
protection,
6-19
NNNNNNNNNNNNNNNNNNNNNNNNNNNNN
AUTO-FEED
,
4-12
NNNNNNNNNNNNNNNNNNNNNNNNNNNNN
AUTO-FEED
use,
4-5
automated
measurements,
6-138{144
automatic
le
naming
convention
for
LIF
format,
4-19
auto
sweep
time
mode
how
to
set,
5-51
auxiliary
input
connector
location,
1-11
available
options,
1-12
averaging,
6-44
changes,
5-56
sweep-to-sweep,
6-5
averaging
factor
how
to
widen,
5-52
4
A
VG
5
key,
6-44
4
A
VG
5
menu
map,
8-2
A
vg
status
notation,
1-7
B
4
5
key,
6-10
bandpass
mode
fault
location
measurements,
6-123
reection
measurements,
6-119
transmission
measurements,
6-121
bandwidth
system:how
to
widen,
5-52
basic
measurement
sequence
and
example,
2-3
basic
system
maintenance
service
option,
1-13
basic
talker
(T6),
11-18
battery
backup
for
memory,
12-2
battery
life,
4-33
bias
inputs
and
fuses
locations,
1-11
bi-directional
lines,
11-16
blanking
the
display,
6-42
broad
band
power
meter
calibration
connections,
3-13
bus
device
modes,
11-19
structure,
11-15,
11-16
C
C10
(pass
control
capabilities),
11-18
C1,C2,C3
(system
controller
capabilities),
11-18
C2
status
notation,
1-7
cabinet,
11-4
cabinet
dimensions,
7-37
cables
HP-IB,
11-5
interconnecting,
5-2
interface,
11-5
test
port
return,
11-2
calculate
statistics
of
the
measurement
data,
2-26
calibrate
menu,
6-73
calibrating
noninsertable
devices,
5-39
calibration
concepts,
6-50{101
considerations,
6-65
data
lost,
12-2
device
measurements,
6-65
fast
2-port,
5-54
for
mixer
measurements,
3-6
for
non-insertable
devices,
6-101
for
noninsertable
devices,
5-41
full
two-port,
6-73
in
memory,
12-2
interpolated
error-correction,
6-72
measurement
parameters,
6-65
modifying
kits,
6-76
omitting
isolation,
6-65
one-port,
6-73
power
meter,
5-33,
6-95
procedure
to
modify
a
user
kit,
6-76
receiver,
5-11
response,
6-73
response
and
isolation,
6-73
restarting,
6-75
saving
data,
6-65
specifying
kits,
6-75
standard
devices,
6-66
standards,
5-6
temperature,
12-5
Index-2
Содержание HP 8753D
Страница 10: ...x ...
Страница 26: ...The CITI le Keyword Reference A 7 Index Contents 16 ...
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Страница 96: ...Figure 2 43 Gain Compression Using Power Sweep 2 48 Making Measurements ...
Страница 115: ...Figure 2 48 2nd Harmonic Power Level in dBc Making Measurements 2 67 ...
Страница 120: ...Figure 2 53 Gating E ects in a Frequency Domain Example Measurement 2 72 Making Measurements ...
Страница 139: ...Figure 3 12 Connections for a High Dynamic Range Swept IF Conversion Loss Measurement Making Mixer Measurements 3 15 ...
Страница 156: ...Figure 3 23 Example Swept Power Conversion Compression Measurement j 3 32 Making Mixer Measurements ...
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Страница 324: ...Figure 6 39 Open Circuit Termination This completes the calibration procedure 6 58 Application and Operation Concepts ...
Страница 334: ...Figure 6 47 Typical Responses of Calibration Standards after Calibration 6 68 Application and Operation Concepts ...
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