
The
error
contributed
by
load
match
is
dependent
on
the
relationship
between
the
actual
output
impedance
of
the
test
device
and
the
eective
match
of
the
return
port
(port
2).
It
is
a
factor
in
all
transmission
measurements
and
in
reection
measurements
of
two-port
devices
.
The
interaction
between
load
match
and
source
match
is
less
signicant
when
the
test
device
insertion
loss
is
greater
than
about
6
dB
.
However
,
source
match
and
load
match
still
interact
with
the
input
and
output
matches
of
the
DUT
,
which
contributes
to
transmission
measurement
errors
.
(These
errors
are
largest
for
devices
with
highly
reective
output
ports
.)
Isolation
(Crosstalk)
Leakage
of
energy
between
analyzer
signal
paths
contributes
to
error
in
a
transmission
measurement,
much
like
directivity
does
in
a
reection
measurement.
Isolation
is
the
vector
sum
of
signals
appearing
at
the
analyzer
samplers
due
to
crosstalk
between
the
reference
and
test
signal
paths
.
This
includes
signal
leakage
within
the
test
set
and
in
both
the
RF
and
IF
sections
of
the
receiver
.
The
error
contributed
by
isolation
depends
on
the
characteristics
of
the
test
device
.
Isolation
is
a
factor
in
high-loss
transmission
measurements
.
However
,
analyzer
system
isolation
is
more
than
sucient
for
most
measurements
,
and
correction
for
it
may
be
unnecessary
.
F
or
measuring
devices
with
high
dynamic
range
,
accuracy
enhancement
can
provide
improvements
in
isolation
that
are
limited
only
by
the
noise
oor
.
Generally
,
the
isolation
falls
below
the
noise
oor
,
therefore
,
when
performing
an
isolation
calibration
you
should
use
a
noise
reduction
function
such
as
averaging
or
reduce
the
IF
bandwidth.
Frequency
Response
(Tracking)
This
is
the
vector
sum
of
all
test
setup
variations
in
which
magnitude
and
phase
change
as
a
function
of
frequency
.
This
includes
variations
contributed
by
signal-separation
devices
,
test
cables
,
adapters
,
and
variations
between
the
reference
and
test
signal
paths
.
This
error
is
a
factor
in
both
transmission
and
reection
measurements
.
F
or
further
explanation
of
systematic
error
terms
and
the
way
they
are
combined
and
represented
graphically
in
error
models
,
refer
to
the
\Characterizing
Microwave
Systematic
Errors"
next.
Characterizing
Microwave
Systematic
Errors
One-P
ort
Error
Model
In
a
measurement
of
the
reection
coecient
(magnitude
and
phase)
of
a
test
device
,
the
measured
data
diers
from
the
actual,
no
matter
how
carefully
the
measurement
is
made
.
Directivity
,
source
match,
and
reection
signal
path
frequency
response
(tracking)
are
the
major
sources
of
error
(see
Figure
6-31).
Application
and
Operation
Concepts
6-53
Содержание HP 8753D
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