Ublox SARA-R4 Series, Command Manual

Page: 153 / 307

SARA-R4/N4 series - AT Commands Manual
UBX-17003787 - R09 14 System features
Page 153 of 307
Command Response Description
AT+UTEST=3,65,8,,2,5000 +UTEST: 65,8,5,2,5000
OK
The module will transmit for 5 s interval 1 slot burst
sequence at TX channel 65 GSM 900 at PCL 8 (gamma
6, 27 dBm) using training sequence 5 and normal 8-PSK
modulation.
AT+UTEST=3,660,,,,0 +UTEST: 660,5,5,1,0
OK
The module will transmit continuously 1 slot burst sequence
at TX channel 660 DCS 1800 at PCL 5 using training
sequence 5 and normal GMSK modulation.
AT+UTEST=3,9612,22,,,200
0 +UTEST: 9612,22,5,1,2000
OK
The module will transmit for 2 s interval at TX channel 9612
band B1 at 22 dBm power level using WCDMA modulation.
AT+UTEST=3,120399,15,,,
3000 +UTEST: 120399,15,5,1,3000
OK
The module transmits for 3 s interval at TX channel 20399
band FDD 4 at 15 dBm power level using SC-FDMA OFDM
modulation 5 MHz bandwidth.
AT+UTEST=3,123230,-10,,,0 +UTEST: 123230,-10,5,1,0
OK
The module continuously transmits at TX channel 23230
band FDD 13 at -10 dBm power level using SC-FDMA OFDM
modulation 5 MHz bandwidth.
Table 13: TX mode test command examples
14.5.7 Digital pins testing description
Defines the commands to perform some verifications on all the digital pins of the u-blox cellular modules.
These pins can be considered as generic digital input / output pins; it is possible to configure one pin as a digital
output with "high" logic level and then verify the voltage level present. Conversely, it is possible set a pin as
a digital input, externally apply a "high" or "low" logic level and then check if the module is able to correctly
measure the voltage level applied.
After the execution of the AT+UTEST=10,5 command, it is possible to externally apply a voltage level to the
enabled input pins and / or measure the voltage level on the pins configured as digital input.
These commands are intended for production to check the correct digital pins behavior, detect possible
soldering or functional problems and can be executed only in non-signalling mode (otherwise the "+CME
ERROR: operation not allowed" or "+CME ERROR: 3" error result code - depending on the
+CMEE AT
command setting - is issued without performing any operations).
Do not exceed the values reported in the Generic Digital Interface section of the module data sheet
when testing a pin as a digital input pin, since stressing the device above the listed ratings may cause a
permanent damage of the module.
SARA-R4 / SARA-N4
See the End User Test Application Note [
133 ] and the corresponding module data sheet for the list of pins
available for testing and their levels characteristics and further test command examples.
14.5.8 Syntax
Type Syntax Response Example
Digital pins testing generic syntax
Set AT+UTEST=10,<op_code>[,[<bit_
padding>]<pin_seq>] OK AT+UTEST=10,3,"0000001000000
300"
OK
Original configuration restoring
Set AT+UTEST=10,0 OK AT+UTEST=10,0
OK
Pins set definition
Set AT+UTEST=10,2,[<bit_
padding>]<pin_seq> OK AT+UTEST=10,2,"0000000C30000
0003000"
OK
Pins configuration
Set AT+UTEST=10,3,[<bit_
padding>]<pin_seq> OK AT+UTEST=10,3,"0000000420000
0001000"
OK