Tektronix NetTek YBT1E1, User Manual

Page: 85 / 122

Testing a Circuit
NetTek YBT1E1 T1 & E1 Circuit Tester User Manual
3- 17
You can create a custom pattern sequence by selecting Remove All
and adding your own contents to the Pattern Sequence list:
1. Select the desired Pattern(s) and associated Pattern Duration in
the list boxes.
2. Select Add .
3. Select Save Sequence .
NOTE
. To start an automated test, you must return to the BERT
Pattern Selection dialog box.
Pattern Sequence Results View
This window displays the results of the automated BER pattern
sequence test; it automatically opens when the sequence is
completed.
Results are displayed in table format, with each row representing one
of the test patterns employed in the test. See Figure 3--11 on
page 3--18.
H
Pattern. The BER test pattern used in this section of the test.
H
Duration. The programmed duration for the transmission of this
test pattern. The format is hh:mm.
H
Pattern Availability. The actual time duration in which the pattern
was received. The format for this column is hh:mm:ss. If the
NetTek YBT1E1 lost pattern synchronization or framing for any
period during the programmed pattern duration, this number will
be minus the Duration. The time required to obtain pattern
synchronization with the incoming pattern may also cause the
Pattern Availability to be less than the programmed duration.
H
Bit Errors. The bit error count for this pattern.
H
Bit Error Rate. The bit error count divided by the number of
received bits during the Pattern Availability duration.
H
BPV. The number of BiPolar Violations received during the
pattern duration.