The Measurement Results Windows
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NetTek YBT1E1 T1 & E1 Circuit Tester User Manual
This value specifies the data collection period represented by each
event indicator in the rolling display. A maximum of 150 time
intervals are allowed before the display memory allocation is
exceeded and previously collected data is overwritten. The Data
Collection Time = Time Interval x 150.
The Display Time Span of the rolling display is also defined by the
data collection resolution, consisting of the most recent 30 time
intervals.
You can scroll beyond the 30 most recent time intervals and access
historical data by tapping and dragging the display scroll bar, which
is located just above the Updates button.
To review the details of the last 150 time intervals (or the number of
errors detected since the beginning of the test) in table format, select
the History tab.
The History Window
To open the History window, tap the
History
tab on the left side of
the display. Figure 2--11 shows an example History window for the
Option T1 application.
Figure 2- 11: History window
Summary of Contents for NetTek YBT1E1
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Page 8: ...Table of Contents iv NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 12: ...General Safety Summary viii NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 16: ...Preface xii NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 17: ...Getting Started...
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Page 40: ...Getting Started 1 22 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 41: ...Operating Basics...
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Page 56: ...Operating Basics 2 14 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 66: ...The Measurement Results Windows 2 24 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 67: ...Reference...
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Page 92: ...Testing a Circuit 3 24 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 93: ...Appendices...
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Page 100: ...Appendix A Specifications A 6 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 110: ...Appendix C Diagnostic Self Tests C 4 NetTek YBT1E1 T1 E1 Circuit Tester User Manual...
Page 113: ...Index...
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