Tektronix 222PS, Operator'S Manual

Page: 95 / 232

Probes
222PS Operator Manual
3Ć49
1. You can use the detachable probe common lead shown in FigĆ
ure 3Ć22 to connect the oscilloscope input common to the referĆ
ence point of the circuit being tested. The probe common lead is
not chassis ground and you can connect it to an active circuit
component. You can therefore make a floating measurement
across a component, with neither point connected to ground
potential.
WARNING
To avoid personal injuryor damage to the 222PS or the
probes, do not applymore than 850 V peak between
probe tip and earth ground, between probe tip and probe
common, or between probe common and earth ground.
2. You can snap the colored cable marker rings shown in FigĆ
ure 3Ć22 into the grooves on the probe cable to distinguish
between the probes connected to channel 1 and channel 2.
3. When testing integrated circuit devices, remove the hook tip and
use the IC lead protection shroud on the probe tip. The shroud
shown in Figure 3Ć22 exposes the sharp probe tip, but it prevents
the probe from creating a short circuit across adjacent IC leads.
4. The hook tip shown in Figure 3Ć22 can connect to accessible test
points such as a component lead or test point connector. This
accessory frees your hands for other tasks.
Probes
222PS Operator Manual
3Ć49
1. You can use the detachable probe common lead shown in FigĆ
ure 3Ć22 to connect the oscilloscope input common to the referĆ
ence point of the circuit being tested. The probe common lead is
not chassis ground and you can connect it to an active circuit
component. You can therefore make a floating measurement
across a component, with neither point connected to ground
potential.
WARNING
To avoid personal injuryor damage to the 222PS or the
probes, do not applymore than 850 V peak between
probe tip and earth ground, between probe tip and probe
common, or between probe common and earth ground.
2. You can snap the colored cable marker rings shown in FigĆ
ure 3Ć22 into the grooves on the probe cable to distinguish
between the probes connected to channel 1 and channel 2.
3. When testing integrated circuit devices, remove the hook tip and
use the IC lead protection shroud on the probe tip. The shroud
shown in Figure 3Ć22 exposes the sharp probe tip, but it prevents
the probe from creating a short circuit across adjacent IC leads.
4. The hook tip shown in Figure 3Ć22 can connect to accessible test
points such as a component lead or test point connector. This
accessory frees your hands for other tasks.