Sun Microsystems W1100z, User Manual

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Chapter 3 Diagnostics 3-7
The Device Test options include the Mechanics Stress Test and the Internal Cache
Test. These tests are relevant to testing nonmedia-related devices associated with the
hard drive hardware, such as the head and internal cache.
As well as choosing any of these tests, you can also define several parameters of the
test.
You can change the parameters within the Test Settings option. Your options within
Test Settings include the following:
■
Media Test Settings
Enables you to choose the test time duration, the percentage of the hard disk to
test, and the sectors to be tested on the hard disk.
■
Device Test Settings
Enables you to select the test time durations of the devices and the test level.
■
Number of Retries
Enables you to select the number of times to retry testing a device before
terminating the test.
■
Maximum Errors
Enables you to select the number of errors allowed before terminating the test.
■
Check SMART First
SMART stands for Smart Monitoring Analysis Reporting Test.
■
HPA Protection
HPA stands for Host Protected Area.
■
Exit