Stanford Research Systems DS345, Manual

Page: 79 / 139

INTRODUCTION
The procedures in this section test the performance of the DS345 and com-
pare it to the specifications in the front of this manual. The first set of tests
test the basic functionality of the DS345 from the front panel. The second set
of tests actually measure the DS345's specifications. The results of each
test may be recorded on the test sheet at the end of this section.
NECESSARY EQUIPMENT
The following equipment is necessary to complete the tests. The suggested
equipment or its equivalent may be used.
Instrument Critical Specifications Recommended Model
Analog Oscilloscope 350 MHz Bandwidth Tektronix 2465
Time Interval Counter Frequency Range: 20 MHz min. SRS SR620
Time Interval Accuracy: 1ns min
FFT Spectrum Analyzer Frequency Range: DC to 100 kHz SRS SR760
Amplitude Accuracy: ±0.2 dB
Distortion: < 75 dB below reference
RF Spectrum Analyzer Frequency Range: 1 kHz to 100 MHz Anritsu MS2601/ HP4195A
Amplitude: ±0.5 dB
Distortion and Spurious: < -70 dB
DC/AC Voltmeter 5 1/2 Digit DC accuracy Fluke 8840A
True RMS AC to 100 kHz
Thermal Converter Input Impedance: 50
Ω
Ballantine 1395A-3-09
Input Voltage: 3 Vrms
Frequency: DC to 30 MHz
Accuracy: ±0.05dB
10 MHz Frequency Standard Frequency: 10 MHz ± .001 ppm SRS FS700
Phase Noise: < -130 dBc @ 100Hz
50
Ω
Terminator 50
Ω
± 0.2 %, 1 Watt HP 11048C
Doubly Balanced Mixer Impedance: 50
Ω
Mini-Circuits ZAD-3SH
Frequency: 1 - 20 MHz
1 MHz Lowpass Filter -50 dB min at f > 15 MHz TTE, Inc. Model J85
15 kHz Lowpass Filter 11.0 k
Ω
, 0.0015
µ
F Homemade
5-1
PERFORMANCE TESTS