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SELECTING THE TEST MODE
There are 31 different types of test mode as shown below. First, select a desired test group by turning the MULTI JOG dial. When the
desired test group is selected, press the ENTER/YES button to set it. After entering a group, select a desired test mode by turning the
MULTI JOG dial. For the contents of the selected test mode, refer to the column “Group” in the following table.
All operations that are required during service and maintenance are included in group “S”. Be careful not to enter any group other than “S”
by mistake.
Display
No.
Contents
Mark
Group (*)
TEMP CHECK
01
Temperature compensation offset check
C
S
LDPER CHECK
02
Laser power check
C
S
EF MO CHECK
03
Traverse (MD) check
C
S
EF CD CHECK
04
Traverse (CD) check
C
S
FBIAS CHECK
05
Focus bias check
C
S
Scurve CHECK
06
S-curve check
(
×
)
C
VERIFY MODE
07
Non-volatile memory check
(
×
)
C
DETRK CHECK
08
Detrack check
(
×
)
C
TEMP ADJUST
09
Temperature compensation offset adjustment
A
S
LDPWR ADJUST
10
Laser power adjustment
A
S
EF MO ADJUST
11
Traverse (MD) adjustment
A
S
EF CD ADJUST
12
Traverse (CD) adjustment
A
S
FBIAS ADJUST
13
Focus bias adjustment
A
S
EEP MODE
14
Non-volatile memory control
(
×
) (!)
D
MANUAL CMD
15
Command transfer
(
×
)
D
SVDATA READ
16
Status display
(
×
)
D
ERR DP MODE
17
Error history display, clear
S
SLED MOVE
18
Sled check
(
×
)
D
ACCESS MODE
19
Access check
(
×
)
D
0920 CHECK
20
Outermost circumference check
(
×
)
D
HEAD ADJUST
21
Head position check
(
×
)
D
CPLAY2 MODE
22
Same function as CPLAY MODE
(
×
)
D
CREC2 MODE
23
Same function as CREC MODE
(
×
)
D
ADJ CLEAR
24
Initialization of adjustment value in non-volatile memory
A
S
AG Set (MO)
25
Auto gain output level adjustment (MO)
A
S
AG Set (CD)
26
Auto gain output level adjustment (CD)
A
S
Iop Read
27
IOP data display
C
S
Iop Write
28
IOP data write
A
S
INFOMATION
29
Microprocessor version display
C
S
CPLAY MODE
30
Continuous playback mode
C
A
S
D
CREC MODE
31
Continuous recording mode
C
A
S
D
•
If you enter a wrong mode by mistake, immediately exit the mode by pressing the MENU/NO button.
•
The test groups with a (
×
) mark in the Mark column are not described in detail because these test groups are not used for servicing. If you
enter one of these groups by mistake, immediately exit the mode by pressing the MENU/NO button.
Be very careful not to enter any test groups with an exclamation mark (!) in the Mark column because the non-volatile memory can be
written in these test groups and the HCD-MD555 will not work correctly.
Displays on Screen when the Test Mode is Selected
•
Name of the selected test mode appears on the upper display.
•
MD1- appears in the lower display.
↑
Indicates the test mode number.
(*) Group
C: Check
A: Adjust
S: Service
D: Develop
Summary of Contents for HCD-MD555
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Page 74: ...HCD MD555 95 96 7 20 SCHEMATIC DIAGRAM PANEL SECTION Refer to page 110 for IC Block Diagrams ...
Page 122: ... 148 MEMO HCD MD555 ...