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Inrevium TD-BD-SDCMPTestC, User Manual

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TD-BD-SDCMPTestC User

’

s Manual 

17 

Rev.1.01 

 

5.2.5.  SMA receptacles 

This system has three SMA receptacles. SMA1 is used to transmit the trigger signal of the oscilloscope. 

SMA2 and SMA3 are unused now. Figure 5-6 shows the location of each SMA receptacle. 

 

Figure 5-6

 

SMA receptacles 

SMA1 

SMA2 

SMA3 

Summary of Contents for TD-BD-SDCMPTestC

Page 1: ...TD BD SDCMPTestC User s Manual 1 Rev 1 01 TD BD SDCMPTestC User s Manual...

Page 2: ...09 11 12 Initial release Rev 0 03 2010 04 23 Remove description about board Typo Rev 0 90 2010 05 11 Add test coverage Rev 0 92 2010 05 25 Replace pictures Typo Rev 1 00 2010 06 04 Official release Re...

Page 3: ...iew of AutoTest 29 7 2 2 AutoTest Operating Procedure 30 7 2 3 AutoTest Setting Dialog Box 33 7 3 Functional Description of Oscilloscope Test 54 7 3 1 Overview of OscilloscopeTest 54 7 3 2 Operation P...

Page 4: ...nual 4 Rev 1 01 8 1 16 6 2 11 CMD DAT Output Fixed Timing for SDR 68 8 1 17 6 2 12 CMD DAT Output Variable Timing for SDR 69 8 1 18 6 2 13 Clock Input Timing for DDR 69 8 1 19 6 2 14 CMD DAT Input and...

Page 5: ...Test Dialog Box 32 Figure 7 8 VDD Settings Tab 33 Figure 7 9 VIH Settings Tab 34 Figure 7 10 Clock Settings Tab 35 Figure 7 11 Delay Settings Tab 37 Figure 7 12 Test Mode Settings Tab 39 Figure 7 13 I...

Page 6: ...DCMPTestC User s Manual 6 Rev 1 01 List of Tables Table 7 1 Operation Mode Frequency and Duty Ratio 36 Table 7 2 Delay Time Setting Values 38 Table 7 3 AutoTest operation 48 Table 8 1 Test Coverage Ta...

Page 7: ...to always keep it handy The following conventions are used to indicate and classify precautions in this manual Failure to observe precautions can result in injury to people or damage to property Indi...

Page 8: ...se the product if some obstruction such as dust is attached to a cooling fan the speed of rotation of a cooling fan is reduced or the fan lead connector is disconnected Otherwise a fire or electric sh...

Page 9: ...rop or fall resulting in injury to persons or failure If the product is dropped or damaged do not use it as is Otherwise a fire or electric shock may occur Do not touch the product with a metallic obj...

Page 10: ...sulting from the use of this product for purposes other than those stated Even if the product is used properly Tokyo Electron Device Limited assumes no responsibility for any damages caused by Earthqu...

Page 11: ...yo Electron Device Limited shall also not be liable for any consequences resulting from the use that is not described in this document No one is permitted to reproduce quote or distribute this documen...

Page 12: ...l 12 Rev 1 01 5 System Description 5 1 External View of the system Figure 5 1 shows an external view of the system Figure 5 1 External View of the TD BD SDCMPTestC system It explains details in each p...

Page 13: ...ives 12V from the AC Adaptor and creates a given voltage using a DC DC converter and a regulator As shown in Figure 5 2 the input power to the system can be supplied by connecting the provided AC Adap...

Page 14: ...TD BD SDCMPTestC User s Manual 14 Rev 1 01 5 2 2 JTAG connector This system has a JTAG connector It is usually unused but it might be used when upgrade is done to this system Figure 5 3 JTAG connector...

Page 15: ...r s Manual 15 Rev 1 01 5 2 3 USB Interfaces This system has a USB interface for system control The USB connector is used to connect the USB s B pin Figure 5 9 shows the location of the connector Figur...

Page 16: ...So the temperature of SD slot 1 can be measured Figure 5 5 shows the location of each connector and header Attention 1 The temperature sensor chip is mounted in slot 1 There is a possibility of comin...

Page 17: ...2 5 SMA receptacles This system has three SMA receptacles SMA1 is used to transmit the trigger signal of the oscilloscope SMA2 and SMA3 are unused now Figure 5 6 shows the location of each SMA recepta...

Page 18: ...PTestC User s Manual 18 Rev 1 01 5 2 6 SD Extension connector This system has a SD extension connector It is unused now Figure 5 7 shows the location of SD extension connector Figure 5 7 SD Extension...

Page 19: ...describes how to install USB Device Driver The driver software is stored in SOFT Release Sys immediately below Release Directory Connect a USB cable to your PC and turn on the power of the board The F...

Page 20: ...t or specific locations and then click Next to continue Select Search for the best driver in these locations and check the Include this location in search checkbox Click Reference and select a folder...

Page 21: ...TD BD SDCMPTestC User s Manual 21 Rev 1 01 When the desired driver has been installed successfully the above screen appears Click Finish...

Page 22: ...Installation Use Device Manager on your PC to confirm the desired device driver has been successfully installed If the driver has been successfully installed the character USB SD TEST appears in the U...

Page 23: ...on GUI Software is stored in Release App immediately below the Release Directory This application consists of the Card Information Auto Test and Oscilloscope Test tabs The Application GUI screen is sh...

Page 24: ...rd Information Tab Function 7 1 1 Overview of Card Information The Card Information tab function initializes the SD memory card and displays information acquired from the SD memory card Figure 7 2 sho...

Page 25: ...to have been initialized with Current Limit 400mA 600mA It is shown to have been initialized with Current Limit 600mA 800mA It is shown to have been initialized with Current Limit 800mA 3 SD Card Cap...

Page 26: ...Ver1 1 Ver2 0 It is shown that the card is SD Spec 2 0 Ver3 0 It is shown that the card is SD Spec 3 0 8 Access Mode Support Access mode support information is displayed The displayed content is as fo...

Page 27: ...TD BD SDCMPTestC User s Manual 27 Rev 1 01 Figure 7 3 Card Register Info dialog...

Page 28: ...n STATUS while executing initialization Initialize Start It changes into Ready when initialization succeeds Please execute it from step 1 again after closing the GUI software and execute OFF and ON th...

Page 29: ...ting in each operation mode Two types of buttons Set and Run are provided for each operation mode on the GUI window While the test is being run a process bar showing how much of the operation is compl...

Page 30: ...the mode you want to run Another dialog will open Complete the operation setting of the corresponding mode When the setting is complete the Run button will be enabled For information on how to set it...

Page 31: ...clicking the Run button While the test is being run a status graph is displayed in the process bar The status display shows the current operation state While the test is being run the Run button chang...

Page 32: ...TD BD SDCMPTestC User s Manual 32 Rev 1 01 When the test is complete the following dialog box will appear Figure 7 7 AutoTest Dialog Box...

Page 33: ...igure 7 7 shows a GUI window of the VDD Settings tab Figure 7 8 VDD Settings Tab This tab allows the user to set a supply voltage for SD Memory Card The Max and Min values can be set in increments of...

Page 34: ...e to UHS I mode 3 3V signals are output Clicking the Default button sets Min to 1 0V and Max to 3 7V in non UHS mode and Min to 1 0V and Max to 2 1V in UHS I mode The test operation is done in 0 1V st...

Page 35: ...n run a test within the range from Min to Max values that have been defined using this tab A five stage duty ratio value is available depending on clock frequency The operation mode operation frequenc...

Page 36: ...DR12 SDR25 SDR50 SDR104 DDR50 Frequency 25MHz 50MHz 25MHz 50MHz 100MHz 208MHz 50MHz 29 70 28 10 29 70 28 10 25 00 25 00 28 10 37 50 37 50 37 50 37 50 37 50 37 50 37 50 50 00 50 00 50 00 50 00 50 00 50...

Page 37: ...except DDR50 mode In DDR50 mode the delay time refers to a delay time starting at both edges The user can run a test within the range of Min to Max values that have been set using this tab A 32 stage...

Page 38: ...6 88ns 15 00ns 7 50ns 15 00ns 7 50ns 3 75ns 1 80ns 7 50ns 16 25ns 8 13ns 16 25ns 8 13ns 4 06ns 1 95ns 8 13ns 17 50ns 8 75ns 17 50ns 8 75ns 4 38ns 2 10ns 8 75ns 18 75ns 9 38ns 18 75ns 9 38ns 4 69ns 2 2...

Page 39: ...nd then select an SD access slot The following describes each parameter setting Setting the Block Address and Block Count Set the address and the number of blocks for each sector 512 byte in hexadecim...

Page 40: ...0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 First 32bit 0x00000000 Second 32bit 0x00000001 Th...

Page 41: ...3 CLK S 0 1 DAT2 DAT1 DAT0 S S S 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 Figure 7 16 Toggle01 Data Pattern File This option outputs the data read from the specified file If this op...

Page 42: ...ck box The initialization of the SD card can be omitted by making this check box effective because of the sequence inside of the test operation As a result the test time can be shortened However even...

Page 43: ...ab Figure 7 18 Summary Data Settings Tab This tab allows the user to set an HTML file for displaying test results a database file for storing test results and a database file to be loaded The followin...

Page 44: ...a file name Setting a database file to be loaded These buttons are used to load a stored database file and regenerate an HTML file Search a target database file using the Search Database File button...

Page 45: ...b is used to save the values set using this window in a file and read from that file The following describes how to use the tab Save Settings To save the current settings in a file specify a target fi...

Page 46: ...tings specify a target file using the Search Settings File button and click the Load Settings File button Note There is SOFT release settings folder in CD ROM The tests that is along with Physical Tes...

Page 47: ...5 6 7 8 9 SD Erase 10 Figure 7 20 AutoTest Flow In Auto Test Pass Fail of the test is decided by judging whether SD Write was able to be normalized repeating SD Initialize SD Erase SD Write SD Read D...

Page 48: ...Card is done by specified address and size of the block 6 Test Setting It sets it in the state that the voltage setting the clock setting and the delay setting are set by the dialog 7 SD Write Writin...

Page 49: ...ML format in the directory specified in the Settings dialog box As shown in Figure 7 20 each HTML file displays summary information on VIH and VDD and pass fail results in combination with VIH and VDD...

Page 50: ...hat test is in Spec and test is PASS 4 Pink indicates that test is in Spec and test is FAIL Character in the table indicates as follows indicates that test is not execute PASS indicates that test is p...

Page 51: ...icates that test is out of SD Physical Spec or test is not execute by the skip setting Yellow indicates that test is in Spec and test is PASS Pink indicates that test is in Spec and test is FAIL Chara...

Page 52: ...e fail Details of the characters are as follows INIT_ERROR indicates fail of SD Initialize ERASE_ERROR indicates fail of SD erase WRITE_ERROR indicates fail of SD Write READ_ERROR indicates fail of SD...

Page 53: ...Detailed HTML Above wave form is indicated whether the test was PASS to the change point of CMD DATA to the CLK signal Painted out with yellow indicates that test is pass pink indicates that test is...

Page 54: ...dow of OscilloscopeTest is shown in Figure 7 24 The OscilloscopeTest tab allows the user to set and run a test in each operation mode On the GUI window the Settings button is provided for each operati...

Page 55: ...corresponding to the mode you want to run Another dialog box will appear Set the corresponding mode operation Setting parameters are described in section 7 3 3 Step 2 Running a Test Click the Run butt...

Page 56: ...the Dump Log File check box will write the measured value one per second If the Dump Log File check box is checked without selecting a log file an error message Please select log file appears Uncheck...

Page 57: ...7 23 This tab is used to measure signal levels of output voltage Figure 7 25 Output Voltage Tab Steps 1 Enter an appropriate SD side block address in the Block Address by hexadecimal 2 Enter an approp...

Page 58: ...rom SMA before SD Read is executed the output signal of the card can be observed by observing the DATA signal after the pulse is detected step operation description 1 SD Initialize SD initialization i...

Page 59: ...3 Enter an appropriate value in the Loop Count by hexadecimal 4 Select a voltage from the VDD field 5 Select a type of access from the Access field Initialize Initialize the SD card using a selected V...

Page 60: ...ead with output current measurement It can observe the card current consumption with the oscilloscope Since the pulse is output from SMA before SD operation e g Initialize is executed the current cons...

Page 61: ...dress in the Block Address by hexadecimal 2 Enter an appropriate block count in the Block Count by hexadecimal 3 Enter an appropriate value in the Loop Count number of test trials by hexadecimal 4 Sel...

Page 62: ...m SMA before SD Read is executed the output signal of the card can be observed by observing the DATA signal after the pulse is detected step operation description 1 SD Initialize SD initialization is...

Page 63: ...ock count in the Block Count by hexadecimal 3 Enter an appropriate value in the Loop Count number of test trials by hexadecimal 4 Select VDD 2 7V to 3 7V 5 Select Driver 6 Select a slot 6 Select a dat...

Page 64: ...m SMA before SD Read is executed the output signal of the card can be observed by observing the DATA signal after the pulse is detected step operation description 1 SD Initialize SD initialization is...

Page 65: ...ation in a part of Tests The item with the limitation describes sign in the table It explains details in each item in the content of four Tests and the execution method Note SPI mode is not supported...

Page 66: ...62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 Blank cells indicate that test items do not exist Green cells indeicate that test items are covered by this test tool Yel...

Page 67: ...It is not possible to measure it with this tool 8 1 3 6 1 3 Supply Voltage Supply Voltage It is possible to measure it with this tool 8 1 4 6 1 4 Current Consumption Current Consumption The card Curr...

Page 68: ...5 Current Consumption Current Consumption The card Current Consumption cannot be verified with this tool An automatic judgment can be done by using the Agilent oscilloscope 8 1 12 6 2 7 Input Capacit...

Page 69: ...be done by using with the Agilent oscilloscope 8 1 18 6 2 13 Clock Input Timing for DDR It is not possible to measure it with this tool 8 1 19 6 2 14 CMD DAT Input and Output Timing for DDR CMD DAT Ou...

Page 70: ...TD BD SDCMPTestC User s Manual 70 Rev 1 01 memo...

Page 71: ...s product names and service names mentioned in this specification are the trademarks or registered trademarks of their respective companies This board is provided on an AS IS basis However non chargea...

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