HP 85108, System Manual

Page: 59 / 136

Pulsed-RF Applications
Pulsed-RF Timing Information
If y our device is sensitive to pulse rep etition p erio d or dut y cycle y ou will need to learn more
ab out ho w these are aected b y the instrumen t state. The following paragraphs pro vide
information that can b e used to predict the in ternal PRP for dieren t instrumen t states.
Netw ork Analyzer Measurement Cycle
Figure 3-19 sho ws the general measuremen t pro cess o w of the net w ork analyzer measuremen t
cycle. F or the frequency domain p oint-in-pulse measuremen t and the pulse prole domain
measuremen t, the HP 8510 measuremen t cycle consists of making the measuremen t, setting up
for the next measuremen t, then w aiting for the next trigger.
Figure 3-19. Netw ork Analyzer Measurement Cycle
Eac h measuremen t cycle is initiated b y the falling edge of the TTL signal at the rear panel
external T rigger Input, or the in ternal 8510 logic, dep ending up on whether external or in ternal
triggering is selected. A t the appropriate time after the trigger, the measuremen t is made.
If a v eraging is turned On but not completed, the pro cess w aits for the next trigger to make
the next measuremen t for that data p oint. If a v eraging is complete but another parameter is
required (2-Port correction is On), the next parameter is selected and the pro cess w aits for the
next trigger. When all data for that p oint is acquired, then the pro cess mov es to the next
p oint, c hanging the frequency if in the frequency domain, or the time if in the pulse prole
domain, then w aits for the next trigger.
These times are represen tativ e t ypical measuremen t cycle times using preset v alues for the
analyzer con trols.
Operation 3-23