Hameg HM 1004-3 Series, Manual

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Subject to change without notice
4
Angewendete harmonisierte Normen / Harmonized standards applied / Normes
harmonisées utilisées
Sicherheit / Safety / Sécurité
EN 61010-1: 1993 / IEC (CEI) 1010-1: 1990 A 1: 1992 / VDE 0411: 1994
EN 61010-1/A2: 1995 / IEC 1010-1/A2: 1995 / VDE 0411 Teil 1/A1: 1996-05
Überspannungskategorie / Overvoltage category / Catégorie de surtension: II
Verschmutzungsgrad / Degree of pollution / Degré de pollution: 2
Elektromagnetische Verträglichkeit / Electromagnetic compatibility /
Compatibilité électromagnétique
EN 61326-1/A1
Störaussendung / Radiation / Emission: Tabelle / table / tableau 4; Klasse / Class /
Classe B.
Störfestigkeit / Immunity / Imunitee: Tabelle / table / tableau A1.
EN 61000-3-2/A14
Oberschwingungsströme / Harmonic current emissions / Émissions de courant
harmonique: Klasse / Class / Classe D.
EN 61000-3-3
Spannungsschwankungen u. Flicker / Voltage fluctuations and flicker /
Fluctuations de tension et du flicker.
Datum /Date /Date Unterschrift / Signature /Signatur
KONFORMITÄTSERKLÄRUNG
DECLARATION OF CONFORMITY
DECLARATION DE CONFORMITE
Instruments
Herstellers HAMEG GmbH
Manufacturer Kelsterbacherstraße 15-19
Fabricant D - 60528 Frankfurt
Bezeichnung / Product name / Designation:
Oszilloskop/Oscilloscope/Oscilloscope
Typ / Type / Type:
HM1004-
3
mit / with / avec: -
Optionen / Options / Options: -
mit den folgenden Bestimmungen / with applicable regulations / avec les
directives suivantes
EMV Richtlinie 89/336/EWG ergänzt durch 91/263/EWG, 92/31/EWG
EMC Directive 89/336/EEC amended by 91/263/EWG, 92/31/EEC
Directive EMC 89/336/CEE amendée par 91/263/EWG, 92/31/CEE
Niederspannungsrichtlinie 73/23/EWG ergänzt durch 93/68/EWG
Low-Voltage Equipment Directive 73/23/EEC amended by 93/68/EEC
Directive des equipements basse tension 73/23/CEE amendée par 93/68/CEE
27.03.2001
E. Baumgartner
Technical Manager /Directeur Technique
General information regarding the CE marking
HAMEG instruments fulfill the regulations of the EMC directive. The conformity test made by HAMEG is based on the actual generic- and product
standards. In cases where different limit values are applicable, HAMEG applies the severer standard. For emission the limits for residential,
commercial and light industry are applied. Regarding the immunity (susceptibility) the limits for industrial environment have been used.
The measuring- and data lines of the instrument have much influence on emmission and immunity and therefore on meeting the acceptance
limits. For different applications the lines and/or cables used may be different. For measurement operation the following hints and conditions
regarding emission and immunity should be observed:
1. Data cables
For the connection between instruments resp. their interfaces and external devices, (computer, printer etc.) sufficiently screened cables must be
used. Without a special instruction in the manual for a reduced cable length, the maximum cable length of a dataline must be less than 3 meters
and not be used outside buildings. If an interface has several connectors only one connector must have a connection to a cable.
Basically interconnections must have a double screening. For IEEE-bus purposes the double screened cables HZ72S and HZ72L from HAMEG are
suitable.
2. Signal cables
Basically test leads for signal interconnection between test point and instrument should be as short as possible. Without instruction in the manual
for a shorter length, signal lines must be less than 3 meters and not be used outside buildings.
Signal lines must screened (coaxial cable - RG58/U). A proper ground connection is required. In combination with signal generators double
screened cables (RG223/U, RG214/U) must be used.
3. Influence on measuring instruments.
Under the presence of strong high frequency electric or magnetic fields, even with careful setup of the measuring equipment an influence of such
signals is unavoidable.
This will not cause damage or put the instrument out of operation. Small deviations of the measuring value (reading) exceeding the instruments
specifications may result from such conditions in individual cases.
4. RF immunity of oscilloscopes.
4.1 Electromagnetic RF field
The influence of electric and magnetic RF fields may become visible (e.g. RF superimposed), if the field intensity is high. In most cases the
coupling into the oscilloscope takes place via the device under test, mains/line supply, test leads, control cables and/or radiation. The device under
test as well as the oscilloscope may be effected by such fields.
Although the interior of the oscilloscope is screened by the cabinet, direct radiation can occur via the CRT gap. As the bandwidth of each amplifier
stage is higher than the total –3dB bandwidth of the oscilloscope, the influence RF fields of even higher frequencies may be noticeable.
4.2 Electrical fast transients / electrostatic discharge
Electrical fast transient signals (burst) may be coupled into the oscilloscope directly via the mains/line supply, or indirectly via test leads and/or
control cables. Due to the high trigger and input sensitivity of the oscilloscopes, such normally high signals may effect the trigger unit and/or may
become visible on the CRT, which is unavoidable. These effects can also be caused by direct or indirect electrostatic discharge.
HAMEG GmbH