Concurrent Technologies VP 110/01 Series, Technical Reference Manual

Page: 112 / 150

11.2.34 Test 68: Real Time Clock Test
This BIST tests the PC compatible, real time clock. The BIST provides a number of sub-tests,
which are selected by a command parameter. If no parameter is supplied the current time and
date is displayed, the interrupt signal is tested and the non-destructive NVRAM test performed.
The sub-tests options are:
0 - Set date and time. Followed by:
Hour (0 - 23),
Minute (0 - 59),
Day (1 - 31),
Month (1 - 12),
Year (0 - 99).
1 - Display time and date, then do interrupt test,
2 - Clear contents of NVRAM,
3 - Display contents of NVRAM,
4 - Non-destructive read/write test of NVRAM.
The RTC periodic interrupt is allowed to interrupt twice to test that the interrupt is acknowledged
correctly.
The read/write test checks each location of NVRAM (excluding the RTC registers). Each address
is tested first with 0x55, then with 0xAA. The contents of NVRAM is saved and restored around
the test.
Error codes:
0300h = Fail. Message will describe failure in some detail
04xyh = Fail, where;
x - 0 = No interrupt occurred
1 = Wrong interrupt occurred
y - Test numbers:
2 = Timer 0 interrupt
4 = Timer 2 interrupt
5 = First RTC periodic interrupt
6 = Second RTC periodic interrupt
11-18 VP 110/01x
VSA Mode Diagnostics