Broadcom NetXtreme Ethernet Adapter • Diagnostic User’s Guide
page 16
Broadcom Confidential and Proprietary
Function:
Tests the PCI-E Power capabilities registers on chips that support the Power
capability. This command is supported on 5751Cx, 5755 and 5787 only.
Default:
Enabled.
3.2.8 A8. Mailbox Register Test
Function:
This test verifies the access integrity of the Mailbox registers. This test is for
5719 and 5720 only.
Default:
Enabled
3.3 Memory Test - B Group
3.3.1 B1. Scratch Pad Test
Command:
memtest -s
Function:
This test tests the scratch pad SRAM on board. The following tests are
performed:
Data Pattern Test:
Write test data into SRAM, read back to ensure data is correct. The test
data used is 0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Alternate Data Pattern Test:
Write test data into SRAM. Write complement test data into
next address. Read back both data to insure the data is correct. After the test, the program
reads back data one more time to insure the data stays correct. The test data used is
0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Address Test:
Write each address with unique increment data. Read back data to insure
data is correct. After fill the entire data with the unique data, the program reads back data
again to insure data stays the same.
Walking Bit Test:
For each address location, starting at bit 0, each bit is set, tested and
then shifted left by one. This process is repeated for each of the 32 bits in each address
location in the entire memory test range.
Pseudo Random Data Test:
A pre-calculated pseudo random data is used to write a unique
data into each test RAM. After the first pass the test, the program reads back one more time
to insure data stays correct.
Default:
Enabled
3.3.2 B2. BD SRAM Test
Command
: memtest -b
