1. Pilot Lamp
2. SWEEP
VOLTAGE
Control
3. VERTICAL
SENSITIVITY
Switch
4. H Terminal
5. G Terminal
6. V Terminal
7. STEP SELECTOR
Switch
A. Current Per
Step positions
B. Ioss/lcEs
position
C. Volts per step
positions
(Polarity
Inverted)
8. POLARITY Switch
CONTROLS AND OPERATOR'S FACILITIES
Lights when unit is on.
Combination on-off switch
and sweep voltage control.
[n the completely counter
clockwise AC OFF position,
power to the unit is off.
Clockwise rotation turns unit
on and sets the maximum
value of the pulsating volt
age at the collector (C) ter
minals; continuously adjust
able from O to IOO volts.
Selects the vertical sensitiv
ity of the oscilloscope so the
collector current can easily
be read. Four scales are
provided which equal 1,2,5
or 10 milliamps per division
of the graticule scale when
the oscilloscope has been
calibrated.
Output of Curve Tracer to
horizontal input of oscillo
scope.
Ground terminal to oscillo
scope.
Output of Curve Tracer to
vertical input of oscilloscope.
17-position rotary switch for
selecting current or voltage
steps.
Selects the base current step
values. The unit automatic
ally generates base current
in five increasing steps. The
switch offers 11 selections
from l µ.A to 2 mA per step.
Shorts gate to source termi
nal for measuring "O Volt"
gate bias drain-to-source cur
rent and shorts base to emit
ter terminal for measuring
collector-emitter leakage cur
rent with "O Volt" base bias.
Selects the gate voltage step
value for testing FET's. The
unit automatically generates
gate voltage in five increas
ing reverse bias steps and
offers 5 selections from .05
to l volt per step.
Selects correct polarity for
testing NPN or PNP transis
tors, and N channel or P
channel FET's.
9. E,S Terminal
IO. B, G Terminal
11. C,D Terminal
12. Right Socket
13. SOCKET Switch
14. Left Socket
15. E,S Terminal
16. B,G Terminal
17. C,D Terminal
18. Graticule
19. Probe
Connection to emitter or
source of semiconductor to
be tested. Active when
SOCKET switch is in RIGHT
position.
Connection to base or gate
of semiconductor to be test
ed. Active when SOCKET
switch is in RIGHT position.
Connection to collector or
drain of semiconductor to be
tested. Active when SOCKET
switch is in RIGHT position.
Test socket for plug-in tran
sistor or FET. Active when
SOCKET switch is in RIGHT
position.
Selects LEFT or RIGHT sock
et and terminals for test.
Sarne as 12 except active
when SOCKET switch is in
LEFT position.
Same as 9 except active
when SOCKET switch is in
LEFT position.
Same as IO except active
when SOCKET switch is in
LEFT position.
Same as 11 except active
when SOCKET switch is in
LEFT position.
Overlay for oscilloscope
screen divides horizontal
and vertical display into IO
divisions for calibrated read
ings.
Provides simultaneous con
nection to all three leads of
a transistor or FET for con
venient in-circuit testing.
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