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OPERATING  INSTRUCTIONS 

GENERAL  DESCRIPTION  OF 

INSTRUMENT  OPERATION 

The  semiconductor  curve  tracer  is  essentially  a 

signal generator that generates precision test signals 

for  application  to  a  semiconductor,  the  results  of 

which are displayed on an oscilloscope. See Figure 2. 

Figure 2. Basic Curve Tracer Operation 

The  curve  tracer  generates  two  signals  that  are 

applied to the semiconductor device under  test. One 

signal is  a variable amplitude 120-Hz sweep voltage 

(full-wave  rectified  DC)  which  is  normally  applied 

to the collector. The other signal consists of constant­

current  steps  which  are  normally  applied  to  the 

base.  For  FET's,  constant-voltage  steps  rather  than 

constant-current steps  are  generated and applied  to 

the  gate. 

The  120-Hz  sweep voltage  is continuously  adjust­

able  from  O  to  100  volts  peak  with  the  SWEEP 

VOLTAGE  control.  This  pulsating  de  voltage  is  of 

positive  polarity  when  the  POLARITY  switch  is  set 

to  NPN  (N  CHAN)  and  of  negative  polarity  when 

the  switch  is  set  to  PNP  (P  CHAN). 

The step generator signal consists of five constant­

current  steps  plus  a  zero-current  step.  The  STEP 

SELECTOR  switch  offers  11  settings  from  1  µ.A  to 

2 mA per step to match normal operating conditions 

for  a  full  range  of  transistor  types.  For  example, 

with  the  STEP  SELECTOR  switch  set  at  50  /tA  per 

step, the current steps are 0,  SO JtA,  100 JtA,  150 /.LA, 

CURVE  TRACER 

/VVVVW\ 

SWEEP  VOLTAGE 

GENERATOR 

200  µ.A  and  250  µA,  then  repeated.  When  the  PO­

LARITY  switch  is in the  NPN position,  the  steps are 

of  positive  polarity,  in  the  PNP  position,  negative 

polarity.  In  the  VOLTS  PER  STEP  positions  of  the 

STEP  SELECTOR  switch,  constant-voltage  steps  are 

generated  for  testing  FET's.  Five  selections  from 

.05 to 1 volt per step are offered. The polarity  of the 

voltage  steps  is  inverted  in  relation  to  the  current 

steps.  That  is,  the  N  CHAN position produces  nega­

tive  voltage  steps,  and  the  P  CHAN  position  pro­

duces positive  voltage  steps  (reverse  bias  steps  are 

required  for  testing  FET's). 

The  sweep voltage  that is applied  to  the collector 

of  the  transistor  is  also  applied  to  the  horizontal 

input  of  the  oscilloscope.  As  the  voltage  increases 

from  zero  to  maximum  and  returns  to  zero,  a  hori­

zontal  sweep  is  produced.  A  precision  resistor  in 

series  with  the  sweep  voltage  source  develops  a 

voltage  that  is  proportional to the  resultant  collector 

current.  The  voltage  developed  across  this  resistor 

is  applied  to  the  vertical  input  of  the  oscilloscope; 

therefore, vertical deflection represents  collector cur­

rent.  Actually,  four  different  precision  resistors  are 

included  and  selected  by  the  VERTICAL  SENSITIV­

ITY  switch  on the  curve  tracer.  This  allows  greater 

versatility  for  displaying  a  wide  range  of  collector 

currents. 

The  steps  of  the  step  generator  are  synchronized 

with the  pulses from the sweep  generator. The  base 

current  remains  at  a  fixed  value  while  the  sweep 

voltage increases from zero to maximum and returns 

to zero. The base current then steps to  the  next  high­

er  fixed  value  while  the  sweep  voltage  completes 

another  cycle.  The  result  is  a  family  of  six  curves, 

one  for  each  step,  with  each  base  current  step  in­

crease  producing  a  higher  collector  current.  The 

display  is  a  dynamic  collector  current  (le)  vs.  col­

lector voltage (Ve) graph. 

OSCILLOSCOPE 

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Figure 3. Basic Block Diagram 

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Summary of Contents for 501A

Page 1: ...Model 501A Semiconductor Curve Tracer...

Page 2: ...ave helped provide better and faster service techniques Close contact has been maintained with the manufacturers of consumer products which our test units will be checking and trouble shooting Key per...

Page 3: ...INSTRUCTION MANUAL FOR B K PRECISION MODEL 501A SEMICONDUCTOR CURVE TRACER 8 K DIVISION OF DYNASCAN CORPORATION 1801 W Belle Plaine Avenue Chicago Illinois 60613 Copyright 1972...

Page 4: ...PPLICATIONS 14 Testing Bipolar Transistors 14 NPN vs PNP Transistors 14 CURRENT GAIN MEASUREMENT 14 DC Current Gain DC beta 15 AC Current Gain AC beta 15 Summary of Transistor Current Gain 16 Current...

Page 5: ...4 IC 5 6 7 8 Q 1 Q 2 3 Q 4 Q 5 6 11 12 Q 8 9 10 SW 2 SW 3 SW 4 SW 5 11 72 488 113 9 002 8 DESCRIPTION CAPACITORS B K PART No 1000 fd 35 Volt Electrolytic Capacitor 022 001 9 015 100 fd 25 Volt Electro...

Page 6: ...SJ TEP l OLA l lIt S lfilJC T TO f W f 0 1T N SOC tt SCLtCTOR SET TO lh Hr l OSIHO t I VUtf J 1 S NSITl TV SW l N l TO jl l Ai IV u 01 i t S1 l I IO i G l l G iT SO J tl T Rw t C t I 1 Ill 1S 1 IW 1 4...

Page 7: ...er general purpose oscilloscope is satisfactory as long as it has external horizontal facilities and is DC coupled The B K Models 1440 1460 and 1465 Oscilloscopes are ideal companions for the Model SO...

Page 8: ...7 8 17 16 15 14 13 12 II 10 9 18 0 0 Figure 1 Controls and Operator s Facilities 2...

Page 9: ...rts base to emit ter terminal for measuring collector emitter leakage cur rent with O Volt base bias Selects the gate voltage step value for testing FET s The unit automatically generates gate voltage...

Page 10: ...sitions of the STEP SELECTOR switch constant voltage steps are generated for testing FET s Five selections from 05 to 1 volt per step are offered The polarity of the voltage steps is inverted in relat...

Page 11: ...rent thru the semiconductor being tested and the hori zontal divisions must accurately represent the sweep voltage applied to the semiconductor being tested that is the oscilloscope must be calibrated...

Page 12: ...of reading the horizontal voltage is available by connecting the sweep voltage output of the curve tracer H jack to the horizontal input of the oscillo scope This method will produce a horizontal trac...

Page 13: ...Ground the vertical input if desired Adjust HORIZONTAL GAIN so 4 Connect a test lead from the H jack of the curve tracer to the horizontal input of the oscilloscope 5 Set the SWEEP VOLTAGE control to...

Page 14: ...aneously switched from one semiconductor to the other The SOCKET switch may also be used to start and stop the test of the semiconductor merely activate the empty socket to stop the test This allows c...

Page 15: ...ied for testing zener diodes leakage of signal and rectifier diodes and inverse peak breakdown voltage Forward bias characteristics show voltage drop across the diode junction and resistive or open co...

Page 16: ...t r 3 2ti l p pr t r 1 l 0 2 3 6 7 8 9 10 ADJUST OSCIL LOSCOPE CENTERING CONTROLS TO PLACE START OF ZERO REFERENCE STEP HERE NPN transistors the display should be posi tioned so the curves start at th...

Page 17: ...f the display Increasing the setting widens the display and may cause the display to go off scale Decrease and increase the setting of the control and note the effect upon the display If increasing th...

Page 18: ...s displayed on the VERTICAL SENSITIVITY range being used If the setting is too high some of the curves may reach the current limiting value and be superim posed on each other causing less than five cu...

Page 19: ...ideal for making contact to transistors mounted on P C Boards Refer to the In circuit Probe section for more information When performing in circuit tests use the fast set up markers on the 501 front...

Page 20: ...turn the VERTICAL SENSITIVITY to the 1 mA Div position after each test so that the next test begins with full protection NPN vs PNP Transistors As described previously in the Typical Test section the...

Page 21: ...ent point Simply approx imate the percentage of distance between the curves above and below the poin use it as a percentage of one step to obtain total base current when added to the number of current...

Page 22: ...to gether at higher collector current Each base current step has precisely the same amount of increase which should cause the collector current curves to be separated by equal amounts if the gain wer...

Page 23: ...d does not introduce distortion If 6 10 s are imbalanced distortion will be intro duced due to this non linearity The greater the im balance the greater the distortion The distortion measurement can b...

Page 24: ...would be destroyed by the test Figure 21 shows a typical family of curves with the sweep voltage set high to cause collector break down In the examples shown in the figure break down occurs at a coll...

Page 25: ...t portion of the family of curves in the area of low collector voltage and current below the knee of each curve Notice that the knee of each curve occurs at approximately the same collector voltage re...

Page 26: ...tance The transistor s output impedance or collector resistance is the reciprocal of its output admittance and is measured in ohms It may be calculated by transposing the current and voltage values us...

Page 27: ...collector voltage at various base currents FET curves are a graph of drain current vs drain voltage at various gate voltages FET breakdown voltage may be observed and measured by the same method used...

Page 28: ...e MOS FET s can be damaged by a voltage transient from a static charge carried by the person handling the device Safeguard against such damage and discharge any static charge by touching ground with o...

Page 29: ...ty may be determined by the same method as desribed for transistors if the spacing between curves is equal the FET is linear Pinch Off Vp Voltage Measurement An important characteristic for depletion...

Page 30: ...scale GERMANIUM SILICON 1 100 80 Io ma 0 5 1 1 5 VF volts FORWARD BIAS 2 2 5 When testing diodes only one curve is displayed not a family of curves as displayed for transistors and FET s The forward b...

Page 31: ...OLT j _ _ 2 I I I ZENER I i 1 1 filgl i I i l j i I I I H i_ i t lJ__tH 10 a 6 VR 4 2 o SHARP ZENER KNEE To obtain the most accurate voltage reading pos sible calibrate the full scale oscilloscope hor...

Page 32: ...y The curves C E appear quite close together and careful observation may be required to distinguish the individual curves It may be helpful to spread out the display by in creasing the horizontal sens...

Page 33: ...e Any anode current at anode voltage below the firing point is forward leakage current and can be read directly from the display Reverse Blocking Voltage Reverse blocking voltage is the maximum revers...

Page 34: ...age and increase the de bias supply until the SCR switches on Measure the value of gate voltage at which switching occurred 2 Set the de bias supply to a specified gate volt age and increase the sweep...

Page 35: ...I I 1 Vp t I I I I 10 I 1 i I i 1 L 1 1 I 1 I 5 I i I 1 5 J MA I I l l Ip peak current start of tunnel region Iv valley current end of tunnel region Vp peak voltage start of tunnel region Vv valley v...

Page 36: ...y soldered wires short TP30 TP31 and TP32 to the S Volt line on the PC board 4 Attach a digital voltmeter to TP29 and turn on AC power to the unit 5 Adjust the CALIBRATE pot R36 for a reading of 3 50...

Page 37: ...board It is most important to follow the explicit control setting and set up pro cedure as given in the notes column in order to obtain the illustrated waveforms Point by point sig nal tracing with a...

Page 38: ...VAC 50 IOkl l IG H VOLTAGE ECONO Ut f aiJitllttN1 u nsim R Sl l0ll S 6 SEL CTOR to a countdown chain composed of 3 flip flops within two IC packages IC3 and 4 The second flip flop of IC4 is not used...

Page 39: ...through the SOCKET SELEC TOR to the desired test socket RIGHT or LEFT The higher voltage secondary of the power trans former is full wave rectified by a diode bridge DI through D4 to produce a 120Hz s...

Page 40: ...se new from an authorl r ed B K distributor Our obligation under this warranty is limited to repairing or replacing any product or component which we are satisfied does not conform with the fore going...

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