background image

for  more  detail). 

VERTICAL  SENSITIVITY-The  setting  of  the  VER­

TICAL  SENSITIVITY  control  is  determined  primarily 

by  physical  size  of  the  transistor  or  semiconductor 
being  tested. Most small signal  transistors,  including 
most small  plastic  case  transistors,  should  be  tested 

at the  1  ma/Div  position.  Some  small  signal  transis­

tors,  including  several  metallic  case  transistors, 
should be tested at the 2 mA/Div position The  5 mA/ 

Div and 10 mA/Div  positions are primarily for  power 
transistors.  The  5  mA/Div  is  for  low  to  medium 

power  transistors  and  include  most  plastic  case 
power transistors  and  those with  self-contained  heat 
radiating  cases.  High  power  transistors  should  be 

tested at 10 mA/Div. Power transistors may  be tested 
without  their  usual heat  sinks if testing  is  limited  to 
a  few  seconds;  just  long  enough  to  make  the  read­
ing.  It  is  especially  important 

to 

keep  testing  time 

short  during  periods  of  voltage  breakdown  and 
current  limiting to  prevent  overheating  and  thermal 
runaway  damage. 

The  curve  tracer  employs  current  limiting  in  the 

collector  voltage  supply  to  prevent  damage  to  the 
transistor being tested. However, the point of  current 

limiting is increased with each step of  the  VERTICAL 

SENSITIVITY  control.  Thus,  the  lowest  acceptable 
setting  of  the  control  must  be  used  to  protect  small 
transistors. Start  with  the lowest  position  (1  mA/Div) 
and  increase  to  a  higher  setting  only  as  necessary. 

STEP  SELECTOR-The  STEP  SELECTOR  switch 

selects  the  base  current  steps.  The  approximate  set­

ting  of  this  control  also  is  somewhat  related  to  the 
physical  size  of  the  transistor.  The  fast  set-up  posi­
tion (10 µ.A per step) is  a good starting point  for most 

signal transistors.  Very 

High-gain 

small  signal  tran­

sistors  will require a  lower setting. Large  signal and 

power  transistors  will  require  a  higher  setting. 

If  transistor  specification  sheets  are  available,  it 

is  desirable  to  use  the  manufacturer's  data  and  set 
the  STEP  SELECTOR  to  produce  the  specified  col­
lector  current  where  Beta  is to  be  measured.  If  data 

sheets are  not available, the  general rule is 

to 

adjust 

the  STEP  SELECTOR  for  the  most  curves  displayed 

on  the  VERTICAL  SENSITIVITY  range  being  used. 

If  the  setting  is  too  high,  some  of  the  curves  may 

reach  the  current  limiting  value  and  be  superim­

posed  on  each  other,  causing  less  than  five  curves 
to be  displayed.  When  more  than  one  position  dis­

plays  all  five  curves,  select  the  position  that  pro­

duces  the  most  even  spacing  between  curves. 

The  Volts  per  Step  positions  are  for  testing  FET's. 

In  these  positions,  step  polarity  is  reversed  with 
respect to  the  sweep  voltage.  The  method  of adjust­
ment  is  the  same;  set  for  the  maximum  number  of 
curves  and  the  most  even  spacing  between  curves 
on  the vertical  range  being  used. 

Sorting and Matching Transistors 

A  better  method  of  oscilloscope  set-up  simplifies 

sorting  and  matching  of  transistors  when  the  types 

are mixed or  unknown.  This technique  is  especially 
helpful when  trying  to  match  the  gain  of  two  oppo­
site  polarity  devices  (NPN  vs  PNP). 

I. Calibrate the oscilloscope vertical axis for 1 volt

full  scale  and  the  horizontal  axis  for  30  volts
full  scale.

2. Adjust  the  oscilloscope  positioning  controls  to

place  the CRT trace  (dot,  with  no  inputs)  within
the  center  circle  of  the special  graticule.

3. Adjust  501  SWEEP  VOLTAGE  until  the  trace

sweeps  out  to  either  edge  of  the  graticule,  de­
pending on which position the POLARITY switch
is set.

4. Set  VERTICAL  SENSITIVITY  to  the  2  mA  posi­

tion.

5. Set  STEP  SELECTOR  to  the  10  ,uA  position.

NPN  transistors  will  now  display  curves  in  the

upper  right-hand  quarter  of  the  graticule,  and  PNP 
in  lower  left-hand  quarter.  The  polarity  of  an  un­
known  device  can  immediately  be  determined  by 
inserting  it into either  socket, switching  to  that  sock­
et, and throwing the SOI  POLARITY switch  back and 

forth  until  curves  appear,  noting  its  position  (See 
Figure  14).  Once  curves  are  displayed,  the  STEP 
SELECTOR  may  need  readjustment  to  bring  all  6 

into view on  the  screen.  Note  that  when  POLARITY 
is  set  to  PNP  for  an  NPN  device  and  vice  versa,  a 

CRT  trace  positioned 

ot  center  of  graticule. 

12 

8) .......... ( .....  1 ..... 

! ' . . 

POLARITY  switch  in  NPN 

position  (curves  displayed)  "'{ 

4) ........... ;, .. , ....... : ... , ... . 

,��1,···1

+

ii' 

LL;L:;;L 

i

4/ 

. ...  ) . ... . 

j ..... 

...... 

(

,otltlon  (polltlon  a  length 

J : : 

··r .. 

�i 

wr 

-1�·········: .......... :-.......... : ........... : .. , ....... �........ 

. ....................... +i5 

Vc(vo1tsl 

Bi 

:  :  :  : 

i  .  !.

...... 

J .......... L ....... ·l· 

........ 

J,, 

POLARITY switch 'in  NPN 

,.,uion  (p.,.ltion  a  length 

........... j ......... 

1,· 

........... , ......... 

of  cur-.e  may  vary) 

4j, 

.......... ,  ......... 

· 

.. ........ · ..... .... 

· 

........... 

· 

........... 

· 

·+· 

... 

:,,,, 

....... ; ........... ; ......... .. .. 

le 

o: 

(ma) 

L

..,,,,,,

�±::::::::i

=::

±::::1 . 

• 15 

....... )  POLARITY  switch  In  PNP 

,  position  (curves  displayed) 

.... ) .......... : ........... ; ........... : ........... ! 

Figure 14.  Determining Transistor Polarity 

Summary of Contents for 501A

Page 1: ...Model 501A Semiconductor Curve Tracer...

Page 2: ...ave helped provide better and faster service techniques Close contact has been maintained with the manufacturers of consumer products which our test units will be checking and trouble shooting Key per...

Page 3: ...INSTRUCTION MANUAL FOR B K PRECISION MODEL 501A SEMICONDUCTOR CURVE TRACER 8 K DIVISION OF DYNASCAN CORPORATION 1801 W Belle Plaine Avenue Chicago Illinois 60613 Copyright 1972...

Page 4: ...PPLICATIONS 14 Testing Bipolar Transistors 14 NPN vs PNP Transistors 14 CURRENT GAIN MEASUREMENT 14 DC Current Gain DC beta 15 AC Current Gain AC beta 15 Summary of Transistor Current Gain 16 Current...

Page 5: ...4 IC 5 6 7 8 Q 1 Q 2 3 Q 4 Q 5 6 11 12 Q 8 9 10 SW 2 SW 3 SW 4 SW 5 11 72 488 113 9 002 8 DESCRIPTION CAPACITORS B K PART No 1000 fd 35 Volt Electrolytic Capacitor 022 001 9 015 100 fd 25 Volt Electro...

Page 6: ...SJ TEP l OLA l lIt S lfilJC T TO f W f 0 1T N SOC tt SCLtCTOR SET TO lh Hr l OSIHO t I VUtf J 1 S NSITl TV SW l N l TO jl l Ai IV u 01 i t S1 l I IO i G l l G iT SO J tl T Rw t C t I 1 Ill 1S 1 IW 1 4...

Page 7: ...er general purpose oscilloscope is satisfactory as long as it has external horizontal facilities and is DC coupled The B K Models 1440 1460 and 1465 Oscilloscopes are ideal companions for the Model SO...

Page 8: ...7 8 17 16 15 14 13 12 II 10 9 18 0 0 Figure 1 Controls and Operator s Facilities 2...

Page 9: ...rts base to emit ter terminal for measuring collector emitter leakage cur rent with O Volt base bias Selects the gate voltage step value for testing FET s The unit automatically generates gate voltage...

Page 10: ...sitions of the STEP SELECTOR switch constant voltage steps are generated for testing FET s Five selections from 05 to 1 volt per step are offered The polarity of the voltage steps is inverted in relat...

Page 11: ...rent thru the semiconductor being tested and the hori zontal divisions must accurately represent the sweep voltage applied to the semiconductor being tested that is the oscilloscope must be calibrated...

Page 12: ...of reading the horizontal voltage is available by connecting the sweep voltage output of the curve tracer H jack to the horizontal input of the oscillo scope This method will produce a horizontal trac...

Page 13: ...Ground the vertical input if desired Adjust HORIZONTAL GAIN so 4 Connect a test lead from the H jack of the curve tracer to the horizontal input of the oscilloscope 5 Set the SWEEP VOLTAGE control to...

Page 14: ...aneously switched from one semiconductor to the other The SOCKET switch may also be used to start and stop the test of the semiconductor merely activate the empty socket to stop the test This allows c...

Page 15: ...ied for testing zener diodes leakage of signal and rectifier diodes and inverse peak breakdown voltage Forward bias characteristics show voltage drop across the diode junction and resistive or open co...

Page 16: ...t r 3 2ti l p pr t r 1 l 0 2 3 6 7 8 9 10 ADJUST OSCIL LOSCOPE CENTERING CONTROLS TO PLACE START OF ZERO REFERENCE STEP HERE NPN transistors the display should be posi tioned so the curves start at th...

Page 17: ...f the display Increasing the setting widens the display and may cause the display to go off scale Decrease and increase the setting of the control and note the effect upon the display If increasing th...

Page 18: ...s displayed on the VERTICAL SENSITIVITY range being used If the setting is too high some of the curves may reach the current limiting value and be superim posed on each other causing less than five cu...

Page 19: ...ideal for making contact to transistors mounted on P C Boards Refer to the In circuit Probe section for more information When performing in circuit tests use the fast set up markers on the 501 front...

Page 20: ...turn the VERTICAL SENSITIVITY to the 1 mA Div position after each test so that the next test begins with full protection NPN vs PNP Transistors As described previously in the Typical Test section the...

Page 21: ...ent point Simply approx imate the percentage of distance between the curves above and below the poin use it as a percentage of one step to obtain total base current when added to the number of current...

Page 22: ...to gether at higher collector current Each base current step has precisely the same amount of increase which should cause the collector current curves to be separated by equal amounts if the gain wer...

Page 23: ...d does not introduce distortion If 6 10 s are imbalanced distortion will be intro duced due to this non linearity The greater the im balance the greater the distortion The distortion measurement can b...

Page 24: ...would be destroyed by the test Figure 21 shows a typical family of curves with the sweep voltage set high to cause collector break down In the examples shown in the figure break down occurs at a coll...

Page 25: ...t portion of the family of curves in the area of low collector voltage and current below the knee of each curve Notice that the knee of each curve occurs at approximately the same collector voltage re...

Page 26: ...tance The transistor s output impedance or collector resistance is the reciprocal of its output admittance and is measured in ohms It may be calculated by transposing the current and voltage values us...

Page 27: ...collector voltage at various base currents FET curves are a graph of drain current vs drain voltage at various gate voltages FET breakdown voltage may be observed and measured by the same method used...

Page 28: ...e MOS FET s can be damaged by a voltage transient from a static charge carried by the person handling the device Safeguard against such damage and discharge any static charge by touching ground with o...

Page 29: ...ty may be determined by the same method as desribed for transistors if the spacing between curves is equal the FET is linear Pinch Off Vp Voltage Measurement An important characteristic for depletion...

Page 30: ...scale GERMANIUM SILICON 1 100 80 Io ma 0 5 1 1 5 VF volts FORWARD BIAS 2 2 5 When testing diodes only one curve is displayed not a family of curves as displayed for transistors and FET s The forward b...

Page 31: ...OLT j _ _ 2 I I I ZENER I i 1 1 filgl i I i l j i I I I H i_ i t lJ__tH 10 a 6 VR 4 2 o SHARP ZENER KNEE To obtain the most accurate voltage reading pos sible calibrate the full scale oscilloscope hor...

Page 32: ...y The curves C E appear quite close together and careful observation may be required to distinguish the individual curves It may be helpful to spread out the display by in creasing the horizontal sens...

Page 33: ...e Any anode current at anode voltage below the firing point is forward leakage current and can be read directly from the display Reverse Blocking Voltage Reverse blocking voltage is the maximum revers...

Page 34: ...age and increase the de bias supply until the SCR switches on Measure the value of gate voltage at which switching occurred 2 Set the de bias supply to a specified gate volt age and increase the sweep...

Page 35: ...I I 1 Vp t I I I I 10 I 1 i I i 1 L 1 1 I 1 I 5 I i I 1 5 J MA I I l l Ip peak current start of tunnel region Iv valley current end of tunnel region Vp peak voltage start of tunnel region Vv valley v...

Page 36: ...y soldered wires short TP30 TP31 and TP32 to the S Volt line on the PC board 4 Attach a digital voltmeter to TP29 and turn on AC power to the unit 5 Adjust the CALIBRATE pot R36 for a reading of 3 50...

Page 37: ...board It is most important to follow the explicit control setting and set up pro cedure as given in the notes column in order to obtain the illustrated waveforms Point by point sig nal tracing with a...

Page 38: ...VAC 50 IOkl l IG H VOLTAGE ECONO Ut f aiJitllttN1 u nsim R Sl l0ll S 6 SEL CTOR to a countdown chain composed of 3 flip flops within two IC packages IC3 and 4 The second flip flop of IC4 is not used...

Page 39: ...through the SOCKET SELEC TOR to the desired test socket RIGHT or LEFT The higher voltage secondary of the power trans former is full wave rectified by a diode bridge DI through D4 to produce a 120Hz s...

Page 40: ...se new from an authorl r ed B K distributor Our obligation under this warranty is limited to repairing or replacing any product or component which we are satisfied does not conform with the fore going...

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