TYPICAL RESULTS
Obtaining meaningful results with the AVR-EBF6-B requires care, experience, and an
understanding of diode transient behavior and the impact of inductive and capacitive
parasitics. To assist the user, typical results are provided below. The user should be
able to reliably duplicate these results.
Additional test results are provided at the end of this manual, generated using the
actual shipped instrument and the specific jig(s) supplied with the instrument.
1N5811 RESULTS
A customer-supplied 1N5811 engineering sample (sample #51) was tested in the AVX-
TRF-ANB jig, using the 8 ns, 10 ns, and 12 ns rise time filters, with the amplitude set to
+25.7V (such that the forward current I
F
= 500 mA). The following forward recovery
waveforms were obtained from the test jig outputs:
Top – Test jig MON output (V
IN
/10, +25.7V, with ~ 8 ns rise time). 1 V/div, 10 ns/div.
Bottom – Test jig main output (V
DUT
/10). 50 mV/div, 10 ns/div.
36
Summary of Contents for 14260
Page 5: ...Last modified July 28 2022 Copyright 2022 Avtech Electrosystems Ltd All Rights Reserved 5...
Page 46: ...PCB 158R4 LOW VOLTAGE POWER SUPPLY...
Page 47: ...PCB 235D HIGH VOLTAGE DC POWER SUPPLY...
Page 48: ...PCB 104H KEYPAD DISPLAY BOARD...
Page 49: ...PCB 201C INTERLOCK CONTROL...
Page 50: ...MAIN WIRING...
Page 52: ...TEST JIG WIRING AVX TFR SOD123W...
Page 53: ...TEST JIG WIRING AVX TFR SOD128...
Page 54: ...PERFORMANCE CHECK SHEET 54...